SEMICONDUCTOR DEVICES

Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode

Mutabar Shah, M. H. Sayyad and Kh. S. Karimov

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Abstract: This paper reports on the fabrication and investigation of a surface-type organic semiconductor copper phthalocyanine (CuPc) based diode. A thin film of CuPc of thickness 100 nm was thermally sublimed onto a glass substrate with preliminary deposited metallic electrodes to form a surface-type Ag/CuPc/Au Schottky diode. The current–voltage characteristics were measured at room temperature under dark conditions. The barrier height was calculated as 1.05 eV. The values of mobility and conductivity was found to be 1.74 × 10-9cm2/(V.s) and 5.5 × 10-6Ω-1·cm-1, respectively. At low voltages the device showed ohmic conduction and the space charge limited current conduction mechanisms were dominated at higher voltages.

Key words: Schottky diode

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    Received: 18 August 2015 Revised: 20 December 2010 Online: Published: 01 April 2011

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      Mutabar Shah, M. H. Sayyad, Kh. S. Karimov. Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode[J]. Journal of Semiconductors, 2011, 32(4): 044001. doi: 10.1088/1674-4926/32/4/044001 M Shah, M H Sayyad, K S Karimov. Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode[J]. J. Semicond., 2011, 32(4): 044001. doi:  10.1088/1674-4926/32/4/044001.Export: BibTex EndNote
      Citation:
      Mutabar Shah, M. H. Sayyad, Kh. S. Karimov. Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode[J]. Journal of Semiconductors, 2011, 32(4): 044001. doi: 10.1088/1674-4926/32/4/044001

      M Shah, M H Sayyad, K S Karimov. Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode[J]. J. Semicond., 2011, 32(4): 044001. doi:  10.1088/1674-4926/32/4/044001.
      Export: BibTex EndNote

      Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode

      doi: 10.1088/1674-4926/32/4/044001
      • Received Date: 2015-08-18
      • Accepted Date: 2010-09-20
      • Revised Date: 2010-12-20
      • Published Date: 2011-03-22

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