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Characteristics of high power LEDs at high and low temperature

Guo Weling, Jia Xuejiao, Yin Fei, Cui Bifeng, Gao Wei, Liu Ying and Yan Weiwei

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Abstract: The high power light emitting diodes (LEDs) based on InGaN and AlGaInP individually are tested on line at temperatures from –30 to 100 ℃. The data are fitted to measure the relationship between temperature and the properties of forward voltage, relative light intensity, wavelength, and spectral bandwidth of two different kinds of LEDs. Why these properties changed and how these changes reflected on applications are also analyzed and compared with each other. The results show that temperature has a great influence on the performance and application of power LEDs. For applications at low temperature, the forward voltage rising and the peak wavelength blue-shifting must be considered; and at high temperature, the relative light intensity decreasing and the peak wavelength red-shifting must be considered.

Key words: power LEDs

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    Received: 18 August 2015 Revised: 21 December 2010 Online: Published: 01 April 2011

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      Guo Weling, Jia Xuejiao, Yin Fei, Cui Bifeng, Gao Wei, Liu Ying, Yan Weiwei. Characteristics of high power LEDs at high and low temperature[J]. Journal of Semiconductors, 2011, 32(4): 044007. doi: 10.1088/1674-4926/32/4/044007 Guo W, Jia X J, Yin F, Cui B F, Gao W, Liu Y, Yan W W. Characteristics of high power LEDs at high and low temperature[J]. J. Semicond., 2011, 32(4): 044007. doi: 10.1088/1674-4926/32/4/044007.Export: BibTex EndNote
      Citation:
      Guo Weling, Jia Xuejiao, Yin Fei, Cui Bifeng, Gao Wei, Liu Ying, Yan Weiwei. Characteristics of high power LEDs at high and low temperature[J]. Journal of Semiconductors, 2011, 32(4): 044007. doi: 10.1088/1674-4926/32/4/044007

      Guo W, Jia X J, Yin F, Cui B F, Gao W, Liu Y, Yan W W. Characteristics of high power LEDs at high and low temperature[J]. J. Semicond., 2011, 32(4): 044007. doi: 10.1088/1674-4926/32/4/044007.
      Export: BibTex EndNote

      Characteristics of high power LEDs at high and low temperature

      doi: 10.1088/1674-4926/32/4/044007
      • Received Date: 2015-08-18
      • Accepted Date: 2010-09-27
      • Revised Date: 2010-12-21
      • Published Date: 2011-03-22

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