J. Semicond. > 2013, Volume 34 > Issue 2 > 025009, doi: 10.1088/1674-4926/34/2/025009
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SEMICONDUCTOR INTEGRATED CIRCUITS

A novel switched capacitor bandgap reference with a correlated double sampling structure

Jianguang Chen1, 2, , Yueguo Hao1, 2 and Yuhua Cheng1, 2

+ Author Affiliations

 Corresponding author: Chen Jianguang, Email:chenjianguang@shrime-pku.org.cn

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Abstract: A switched capacitor bandgap voltage reference with correlated double sampling structure embedded in a temperature sensor is implemented in a standard 0.35 μm CMOS process. Due to the smaller change of the op-amp's output voltage, this topology is very suitable for low power applications. In addition, errors caused by the finite op-amp gain, input offset voltage, and 1/f noise are eliminated with the correlated double sampling technique. Additionally, two-level process calibration techniques are designed to minimize the process spread. Finally, a method of getting a full period valid reference voltage output is discussed and experimental results are provided to verify the effectiveness of the proposed structure.

Key words: bandgap, correlated double sampling, low power, switched capacitor



[1]
Leung K N, Mok P K T, Leung C Y. A 2-V 23-μA 5.3-ppm/℃ curvature-compensated CMOS bandgap voltage reference. IEEE J Solid-State Circuits, 2003, 38(3):561 doi: 10.1109/JSSC.2002.808328
[2]
Leung C Y, Leunq K N, Mok T K. Design of a 1.5 V high-order curvature-compensated CMOS bandgap reference. Journal of Circuit and System, 2004, 1:49 http://web.mit.edu/Magic/Public/papers/IEEEXplore(29).pdf
[3]
Gregorie B R. Switched capacitor voltage reference circuits using transconductance circuit to generate reference voltage. USA Patent, No. 6819163, 2004 http://www.koreascience.or.kr/article/ArticleFullRecord.jsp?cn=E1STAN_2014_v14n1_70
[4]
Zheng Peng, Yan Wei, Zhang Ke, et al. An offset-insensitive switched-capacitor bandgap reference with continuous output. Journal of Semiconductors, 2009, 30(8):085006 doi: 10.1088/1674-4926/30/8/085006
[5]
Martin K, Ozcolak L, Lee Y S, et al. A differential switched-capacitor amplifier. IEEE J Solid-State Circuits, 1987, 22(1):104 doi: 10.1109/JSSC.1987.1052678
[6]
Lacerda F, Pietri S, Olmos A. A differential switched-capacitor amplifier with programmable gain and output offset voltage. SBCCI, 2006
[7]
Gray P R, Hurst P J, Lewis S H, et al. Analysis and design of analog integrated circuits. New York:John Wiley & Sons, 2003
[8]
Enz C C, Temes G C. Circuit techniques for reducing the effects of op-amp imperfections:autozeroing, correlated double sampling, and chopper stabilization. Proc IEEE, 1996, 84(11):1584 doi: 10.1109/5.542410
[9]
Matsumoto H. Spike-free switched-capacitor circuits. Electron Lett, 1987, 23(8):428 doi: 10.1049/el:19870310
[10]
Ptrtijs M A P, Niederkorn A, Ma X, et al. A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5℃ from-55℃ to 120℃. IEEE J Solid-State Circuits, 2005, 40(2):454 doi: 10.1109/JSSC.2004.841013
Fig. 1.  (a) Diagram of the proposed SC CDS bandgap reference. (b) Structure of the proposed switched capacitor amplifier.

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Fig. 2.  Diagram of calibration effects.

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Fig. 3.  (a) Structure of the two-phase non-overlapped clock generator. (b) Waveforms of the non-overlapped clock phase.

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Fig. 4.  Schematic of a single stage op-amp.

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Fig. 5.  Chip microphotograph.

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Fig. 6.  (a) Simulation results with 20 mV offset voltage. (b) Waveforms of the voltage reference.

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Fig. 7.  Temperature performance with different power supply voltages.

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Table 1.   Performance comparison.
[1]
Leung K N, Mok P K T, Leung C Y. A 2-V 23-μA 5.3-ppm/℃ curvature-compensated CMOS bandgap voltage reference. IEEE J Solid-State Circuits, 2003, 38(3):561 doi: 10.1109/JSSC.2002.808328
[2]
Leung C Y, Leunq K N, Mok T K. Design of a 1.5 V high-order curvature-compensated CMOS bandgap reference. Journal of Circuit and System, 2004, 1:49 http://web.mit.edu/Magic/Public/papers/IEEEXplore(29).pdf
[3]
Gregorie B R. Switched capacitor voltage reference circuits using transconductance circuit to generate reference voltage. USA Patent, No. 6819163, 2004 http://www.koreascience.or.kr/article/ArticleFullRecord.jsp?cn=E1STAN_2014_v14n1_70
[4]
Zheng Peng, Yan Wei, Zhang Ke, et al. An offset-insensitive switched-capacitor bandgap reference with continuous output. Journal of Semiconductors, 2009, 30(8):085006 doi: 10.1088/1674-4926/30/8/085006
[5]
Martin K, Ozcolak L, Lee Y S, et al. A differential switched-capacitor amplifier. IEEE J Solid-State Circuits, 1987, 22(1):104 doi: 10.1109/JSSC.1987.1052678
[6]
Lacerda F, Pietri S, Olmos A. A differential switched-capacitor amplifier with programmable gain and output offset voltage. SBCCI, 2006
[7]
Gray P R, Hurst P J, Lewis S H, et al. Analysis and design of analog integrated circuits. New York:John Wiley & Sons, 2003
[8]
Enz C C, Temes G C. Circuit techniques for reducing the effects of op-amp imperfections:autozeroing, correlated double sampling, and chopper stabilization. Proc IEEE, 1996, 84(11):1584 doi: 10.1109/5.542410
[9]
Matsumoto H. Spike-free switched-capacitor circuits. Electron Lett, 1987, 23(8):428 doi: 10.1049/el:19870310
[10]
Ptrtijs M A P, Niederkorn A, Ma X, et al. A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5℃ from-55℃ to 120℃. IEEE J Solid-State Circuits, 2005, 40(2):454 doi: 10.1109/JSSC.2004.841013

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    Received: 25 June 2012 Revised: 29 August 2012 Online: Published: 01 February 2013

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      Article Navigation >  Journal of Semiconductors  > 2013  >  34(2): 025009
      Jianguang Chen, Yueguo Hao, Yuhua Cheng. A novel switched capacitor bandgap reference with a correlated double sampling structure[J]. Journal of Semiconductors, 2013, 34(2): 025009. doi: 10.1088/1674-4926/34/2/025009 J G Chen, Y G Hao, Y H Cheng. A novel switched capacitor bandgap reference with a correlated double sampling structure[J]. J. Semicond., 2013, 34(2): 025009. doi: 10.1088/1674-4926/34/2/025009.Export: BibTex EndNote
      Citation:
      Jianguang Chen, Yueguo Hao, Yuhua Cheng. A novel switched capacitor bandgap reference with a correlated double sampling structure[J]. Journal of Semiconductors, 2013, 34(2): 025009. doi: 10.1088/1674-4926/34/2/025009

      J G Chen, Y G Hao, Y H Cheng. A novel switched capacitor bandgap reference with a correlated double sampling structure[J]. J. Semicond., 2013, 34(2): 025009. doi: 10.1088/1674-4926/34/2/025009.
      Export: BibTex EndNote
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      A novel switched capacitor bandgap reference with a correlated double sampling structure

      doi: 10.1088/1674-4926/34/2/025009
      • 1.

        System-on-Chip Laboratory, Institute of Microelectronics, Peking University, Beijing 100871, China

      • 2.

        Shanghai Research Institute of Microelectronics(Shrime), Peking University, Shanghai 201023, China

      Funds:

      Project supported by the National Science and Technology Major Projects of China (No. 2012ZX02503-005) and the Research Program of Science and Technology Commission of Shanghai (No. 11511500903)

      the Research Program of Science and Technology Commission of Shanghai 11511500903

      the National Science and Technology Major Projects of China 2012ZX02503-005

      More Information
      • Corresponding author: Chen Jianguang, Email:chenjianguang@shrime-pku.org.cn
      • Received Date: 2012-06-25
      • Revised Date: 2012-08-29
      • Published Date: 2013-02-01

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