Fig. 1.
Block diagram of the UC1845AJ[11].
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| Citation: |
Wen Zhao, Xiaoqiang Guo, Wei Chen, Hongxia Guo, Dongsheng Lin, Hanning Wang, Yinhong Luo, Lili Ding, Yuanming Wang. Experimental study on the single event effects in pulse width modulators by laser testing[J]. Journal of Semiconductors, 2015, 36(11): 115008. doi: 10.1088/1674-4926/36/11/115008
W Zhao, X Q Guo, W Chen, H X Guo, D S Lin, H N Wang, Y H Luo, L L Ding, Y M Wang. Experimental study on the single event effects in pulse width modulators by laser testing[J]. J. Semicond., 2015, 36(11): 115008. doi: 10.1088/1674-4926/36/11/115008.
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Experimental study on the single event effects in pulse width modulators by laser testing
doi: 10.1088/1674-4926/36/11/115008
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Abstract
This paper presents single event effect (SEE) characteristics of UC1845AJ pulse width modulators (PWMs) by laser testing. In combination with analysis to map PWM circuitry in the microchip dies, the typical SEE response waveforms for laser pulses located in different circuit blocks of UC1845AJ are obtained and the SEE mechanisms are analyzed. The laser SEE test results show that there are some differences in the SEE mechanisms of different circuit blocks, and phase shifts or changes in the duty cycles of few output pulses are the main SEE behaviors for UC1845AJ. In addition, a new SEE behavior which manifests as changes in the duty cycles of many output pulses is revealed. This means that an SEE hardened design should be considered.-
Keywords:
- laser simulation,
- pulse width modulator,
- single event effect
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References
[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] -
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