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Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser

Tianjiang He1, 2, Suping Liu1, , Wei Li1, 2, Li Zhong1, 2, Xiaoyu Ma1, 2, Cong Xiong1, Nan Lin1, 2 and Zhennuo Wang1, 2

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 Corresponding author: Suping Liu, spliu@semi.ac.cn

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Abstract: Output power and reliability are the most important characteristic parameters of semiconductor lasers. However, catastrophic optical damage (COD), which usually occurs on the cavity surface, will seriously damage the further improvement of the output power and affect the reliability. To improve the anti-optical disaster ability of the cavity surface, a non-absorption window (NAW) is adopted for the 915 nm InGaAsP/GaAsP single-quantum well semiconductor laser using quantum well mixing (QWI) induced by impurity-free vacancy. Both the principle and the process of point defect diffusion are described in detail in this paper. We also studied the effects of annealing temperature, annealing time, and the thickness of SiO2 film on the quantum well mixing in a semiconductor laser with a primary epitaxial structure, which is distinct from the previous structures. We found that when compared with the complete epitaxial structure, the blue shift of the semiconductor laser with the primary epitaxial structure is larger under the same conditions. To obtain the appropriate blue shift window, the primary epitaxial structure can use a lower annealing temperature and shorter annealing time. In addition, the process is less expensive. We also provide references for upcoming device fabrication.

Key words: catastrophic optical damageprimary epitaxial structureimpurity-free vacancy disorderingquantum well intermixingnon-absorption window



[1]
Liu C C, Nan L, Cong X, et al. Intermixing in InGaAs/AlGaAs quantum well structures induced by the interdiffusion of Si impurities. Chin Opt, 2020, 13, 203 doi: 10.3788/co.20201301.0203
[2]
Lin T, Li Y N, Xie J N, et al. Quantum well intermixing of tensile strain GaInP quantum well structures induced by ion implantation and thermal annealing. Mater Sci Semicond Process, 2022, 138, 106306 doi: 10.1016/j.mssp.2021.106306
[3]
Lin T, Li Y N, Xie J N, et al. Composition and interface research on quantum well intermixing between a tensile GaInP quantum well and compressed AlGaInP barriers. J Electron Mater, 2022, 51, 4368 doi: 10.1007/s11664-022-09704-6
[4]
Ky N H, Ganière J D, Gailhanou M, et al. Self-interstitial mechanism for Zn diffusion-induced disordering of GaAs/AlxGa1–xAs (x=0.1–1) multiple-quantum-well structures. J Appl Phys, 1993, 73, 3769 doi: 10.1063/1.352883
[5]
Hadj Alouane M H, Ilahi B, Maaref H, et al. Impact of ion-implantation-induced band gap engineering on the temperature-dependent photoluminescence properties of InAs/InP quantum dashes. J Appl Phys, 2010, 108, 024317 doi: 10.1063/1.3460646
[6]
Walker C L, Bryce A C, Marsh J H. Non absorbing mirror laser with improved catastrophic optical damage level. The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003, 643 doi: 10.1109/LEOS.2002.1159470
[7]
Ueno Y, Endo K, Fujii H, et al. Continuous-wave high-power (75 mW) operation of a transverse-mode stabilised window-structure 680 nm AlGaInP visible laser diode. Electron Lett, 1990, 26, 1726 doi: 10.1049/el:19901102
[8]
McDougall S D, Jubber M J, Kowalski O P, et al. GaAs/AlGaAs waveguide pin photodiodes with non-absorbing input facets fabricated by quantum well intermixing. Electron Lett, 2000, 36, 749 doi: 10.1049/el:20000589
[9]
Naito H, Nagakura T, Torii K, et al. Long-term reliability of 915-nm broad-area laser diodes under 20-W CW operation. IEEE Photonics Technol Lett, 2015, 27, 1660 doi: 10.1109/LPT.2015.2433927
[10]
Wang X, Zhao Y H, Zhu L N, et al. Impurity-free vacancy diffusion induces quantum well intermixing in 915 nm semiconductor laser based on SiO2 film. ACTA PHOTONICA SINICA, 2018, 47, 314003 doi: 10.3788/gzxb20184703.0314003
[11]
Zhang N L, Jing H Q, Yuan Q H, et al. Influence of diffusion barriers with different Al compositions on impurity-free vacancy induced quantum well mixing. Chin J Lasers, 2021, 48, 2403001 doi: 10.3788/CJL202148.2403001
[12]
Deppe D G, Holonyak N Jr. Atom diffusion and impurity-induced layer disordering in quantum well III-V semiconductor heterostructures. J Appl Phys, 1988, 64, R93 doi: 10.1063/1.341981
[13]
Hulko O, Thompson D A, Simmons J G. Quantitative compositional profiles of enhanced intermixing in GaAs/AlGaAs quantum well heterostructures annealed with and without a SiO2 cap layer. Semicond Sci Technol, 2009, 24, 045015 doi: 10.1088/0268-1242/24/4/045015
[14]
Gontijo I, Krauss T, Marsh J H, et al. Postgrowth control of GaAs/AlGaAs quantum well shapes by impurity-free vacancy diffusion. IEEE J Quantum Electron, 1994, 30, 1189 doi: 10.1109/3.303680
[15]
Liu C C, Lin N, Ma X Y, et al. High performance InGaAs/AlGaAs quantum well semiconductor laser diode with non-absorption window. Chin J Lumin, 2022, 43(1), 110 doi: 10.37188/CJL.20210306
[16]
Lin T, Sun H, Zhang H Q, et al. Present status of impurity free vacancy disordering research and application. Laser Optoelectron Prog, 2015, 52, 030003 doi: 10.3788/LOP52.030003
[17]
Asano H, Wada M, Fukunaga T, et al. Temperature-insensitive operation of real index guided 1.06 μm InGaAs/GaAsP strain-compensated single-quantum-well laser diodes. Appl Phys Lett, 1999, 74, 3090 doi: 10.1063/1.124071
[18]
He T J, Liu S P, Li W, et al. Research on quantum well intermixing of 680 nm AlGaInP/GaInP semiconductor lasers induced by composited Si–Si3N4 dielectric layer. J Semicond, 2022, 43, 082301 doi: 10.1088/1674-4926/43/8/082301
[19]
He T J, Jing H Q, Zhu L N, et al. Research on quantum well intermixing of 915 nm InGaAs/GaAsP primary epitaxial wafers. Acta Optica Sinica. Acta Opt Sin, 2022, 42, 0114003 doi: 10.3788/AOS202242.0114003
[20]
Pan Z, Li L H, Zhang W, et al. Effect of rapid thermal annealing on GaInNAs/GaAs quantum wells grown by plasma-assisted molecular-beam epitaxy. Appl Phys Lett, 2000, 77, 1280 doi: 10.1063/1.1289916
[21]
Oh Y T, Kang T W, Hong C Y, et al. The relation between Ga vacancy concentrations and diffusion lengths in intermixed GaAs/Al0.35Ga0.65As multiple quantum wells. Solid-State Commun, 1995, 96, 241 doi: 10.1016/0038-1098(95)00367-3
[22]
Hulko O, Thompson D A, Czaban J A, et al. The effect of different proximity caps on quantum well intermixing in InGaAsP/InP QW structures. Semicond Sci Technol, 2006, 21, 870 doi: 10.1088/0268-1242/21/7/008
Fig. 1.  (Color online) The simulated deformation of GaAs layer and SiO2 layer at 870 °C.

Fig. 2.  (Color online) Schematic diagram of surface compress stress-induced vacancy generation.

Fig. 3.  (Color online) Variation of In composition versus the diffusion length.

Fig. 4.  (Color online) With the decrease of In component, the gain spectrum gradually shifts to blue.

Fig. 5.  Epitaxial structure of 915 nm semiconductor laser. (a) Sample 1; (b) Sample 2.

Fig. 6.  (Color online) The PL spectrums at different annealing temperatures. (a) Sample 1; (b) Sample 2.

Fig. 7.  (Color online) Influence of annealing time on quantum well intermixing. (a) Sample 1; (b) Sample 2.

Fig. 8.  Effect of different SiO2 thicknesses on the PL spectrum peaks.

Table 1.   Young's modulus, Poisson's ratio, density, and thermal expansion coefficient of GaAs and SiO2.

Parameters GaAs SiO2
Young's modulus (1010 Pa) 8.50 7.31
Poisson's ratio 0.31 0.17
Density (kg/cm3) 5500 2203
Thermal expansion coefficient (10−7 k-1) 64 5.50
DownLoad: CSV

Table 2.   Conditions for SiO2 growth using PECVD.

Parameters Value
N2 flow rate (sccm) 3000
Ar flow rate (sccm) 1000
SiH4 flow rate (sccm) 13
N2O flow rate (sccm) 520
Growth temperature (°C) 280
Growth pressure (mTorr) 1
DownLoad: CSV
[1]
Liu C C, Nan L, Cong X, et al. Intermixing in InGaAs/AlGaAs quantum well structures induced by the interdiffusion of Si impurities. Chin Opt, 2020, 13, 203 doi: 10.3788/co.20201301.0203
[2]
Lin T, Li Y N, Xie J N, et al. Quantum well intermixing of tensile strain GaInP quantum well structures induced by ion implantation and thermal annealing. Mater Sci Semicond Process, 2022, 138, 106306 doi: 10.1016/j.mssp.2021.106306
[3]
Lin T, Li Y N, Xie J N, et al. Composition and interface research on quantum well intermixing between a tensile GaInP quantum well and compressed AlGaInP barriers. J Electron Mater, 2022, 51, 4368 doi: 10.1007/s11664-022-09704-6
[4]
Ky N H, Ganière J D, Gailhanou M, et al. Self-interstitial mechanism for Zn diffusion-induced disordering of GaAs/AlxGa1–xAs (x=0.1–1) multiple-quantum-well structures. J Appl Phys, 1993, 73, 3769 doi: 10.1063/1.352883
[5]
Hadj Alouane M H, Ilahi B, Maaref H, et al. Impact of ion-implantation-induced band gap engineering on the temperature-dependent photoluminescence properties of InAs/InP quantum dashes. J Appl Phys, 2010, 108, 024317 doi: 10.1063/1.3460646
[6]
Walker C L, Bryce A C, Marsh J H. Non absorbing mirror laser with improved catastrophic optical damage level. The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003, 643 doi: 10.1109/LEOS.2002.1159470
[7]
Ueno Y, Endo K, Fujii H, et al. Continuous-wave high-power (75 mW) operation of a transverse-mode stabilised window-structure 680 nm AlGaInP visible laser diode. Electron Lett, 1990, 26, 1726 doi: 10.1049/el:19901102
[8]
McDougall S D, Jubber M J, Kowalski O P, et al. GaAs/AlGaAs waveguide pin photodiodes with non-absorbing input facets fabricated by quantum well intermixing. Electron Lett, 2000, 36, 749 doi: 10.1049/el:20000589
[9]
Naito H, Nagakura T, Torii K, et al. Long-term reliability of 915-nm broad-area laser diodes under 20-W CW operation. IEEE Photonics Technol Lett, 2015, 27, 1660 doi: 10.1109/LPT.2015.2433927
[10]
Wang X, Zhao Y H, Zhu L N, et al. Impurity-free vacancy diffusion induces quantum well intermixing in 915 nm semiconductor laser based on SiO2 film. ACTA PHOTONICA SINICA, 2018, 47, 314003 doi: 10.3788/gzxb20184703.0314003
[11]
Zhang N L, Jing H Q, Yuan Q H, et al. Influence of diffusion barriers with different Al compositions on impurity-free vacancy induced quantum well mixing. Chin J Lasers, 2021, 48, 2403001 doi: 10.3788/CJL202148.2403001
[12]
Deppe D G, Holonyak N Jr. Atom diffusion and impurity-induced layer disordering in quantum well III-V semiconductor heterostructures. J Appl Phys, 1988, 64, R93 doi: 10.1063/1.341981
[13]
Hulko O, Thompson D A, Simmons J G. Quantitative compositional profiles of enhanced intermixing in GaAs/AlGaAs quantum well heterostructures annealed with and without a SiO2 cap layer. Semicond Sci Technol, 2009, 24, 045015 doi: 10.1088/0268-1242/24/4/045015
[14]
Gontijo I, Krauss T, Marsh J H, et al. Postgrowth control of GaAs/AlGaAs quantum well shapes by impurity-free vacancy diffusion. IEEE J Quantum Electron, 1994, 30, 1189 doi: 10.1109/3.303680
[15]
Liu C C, Lin N, Ma X Y, et al. High performance InGaAs/AlGaAs quantum well semiconductor laser diode with non-absorption window. Chin J Lumin, 2022, 43(1), 110 doi: 10.37188/CJL.20210306
[16]
Lin T, Sun H, Zhang H Q, et al. Present status of impurity free vacancy disordering research and application. Laser Optoelectron Prog, 2015, 52, 030003 doi: 10.3788/LOP52.030003
[17]
Asano H, Wada M, Fukunaga T, et al. Temperature-insensitive operation of real index guided 1.06 μm InGaAs/GaAsP strain-compensated single-quantum-well laser diodes. Appl Phys Lett, 1999, 74, 3090 doi: 10.1063/1.124071
[18]
He T J, Liu S P, Li W, et al. Research on quantum well intermixing of 680 nm AlGaInP/GaInP semiconductor lasers induced by composited Si–Si3N4 dielectric layer. J Semicond, 2022, 43, 082301 doi: 10.1088/1674-4926/43/8/082301
[19]
He T J, Jing H Q, Zhu L N, et al. Research on quantum well intermixing of 915 nm InGaAs/GaAsP primary epitaxial wafers. Acta Optica Sinica. Acta Opt Sin, 2022, 42, 0114003 doi: 10.3788/AOS202242.0114003
[20]
Pan Z, Li L H, Zhang W, et al. Effect of rapid thermal annealing on GaInNAs/GaAs quantum wells grown by plasma-assisted molecular-beam epitaxy. Appl Phys Lett, 2000, 77, 1280 doi: 10.1063/1.1289916
[21]
Oh Y T, Kang T W, Hong C Y, et al. The relation between Ga vacancy concentrations and diffusion lengths in intermixed GaAs/Al0.35Ga0.65As multiple quantum wells. Solid-State Commun, 1995, 96, 241 doi: 10.1016/0038-1098(95)00367-3
[22]
Hulko O, Thompson D A, Czaban J A, et al. The effect of different proximity caps on quantum well intermixing in InGaAsP/InP QW structures. Semicond Sci Technol, 2006, 21, 870 doi: 10.1088/0268-1242/21/7/008
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    Received: 19 February 2023 Revised: 24 March 2023 Online: Accepted Manuscript: 26 May 2023Uncorrected proof: 26 May 2023Corrected proof: 04 September 2023Published: 10 October 2023

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      Tianjiang He, Suping Liu, Wei Li, Li Zhong, Xiaoyu Ma, Cong Xiong, Nan Lin, Zhennuo Wang. Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser[J]. Journal of Semiconductors, 2023, 44(10): 102302. doi: 10.1088/1674-4926/44/10/102302 T J He, S P Liu, W Li, L Zhong, X Y Ma, C Xiong, N Lin, Z N Wang. Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser[J]. J. Semicond, 2023, 44(10): 102302. doi: 10.1088/1674-4926/44/10/102302Export: BibTex EndNote
      Citation:
      Tianjiang He, Suping Liu, Wei Li, Li Zhong, Xiaoyu Ma, Cong Xiong, Nan Lin, Zhennuo Wang. Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser[J]. Journal of Semiconductors, 2023, 44(10): 102302. doi: 10.1088/1674-4926/44/10/102302

      T J He, S P Liu, W Li, L Zhong, X Y Ma, C Xiong, N Lin, Z N Wang. Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser[J]. J. Semicond, 2023, 44(10): 102302. doi: 10.1088/1674-4926/44/10/102302
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      Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser

      doi: 10.1088/1674-4926/44/10/102302
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      • Author Bio:

        Tianjiang He received his BS degree from Huazhong University of Science and Technology in 2019. He is now a PhD student at University of Chinese Academy of Sciences under the supervision of Prof. Xiaoyu Ma. His research focuses on high power semiconductor lasers

        Suping Liu received her BS degree in 1992 and MS degree in 1995 at Jilin University. She then joined the Xiaoyu Ma Group at the Institute of Semiconductors, Chinese Academy of Sciences as a senior engineer. Her research interests include high power semiconductor lasers and their components, solid state lasers and storage lasers

      • Corresponding author: spliu@semi.ac.cn
      • Received Date: 2023-02-19
      • Revised Date: 2023-03-24
      • Available Online: 2023-05-26

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