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Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers

Qin Zhengkun, Ma Chunsheng, Li Delu, Zhang Haiming, Zhang Daming and Liu Shiyong

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Abstract: The effects of manufacturing tolerances on transmission characteristics are analyzed for a 3333 polymer arrayed waveguide grating (AWG) multiplexer via transmission theory. Simulated results show that manufacturing tolerances result in a shift of the transmission spectrum and in the increase of the crosstalk compared with theoretical device. The accumulation and compensation of manufacturing tolerances are investigated. In order to realize the normal demultiplexing for a fabricated AWG device, some allowed manufacturing tolerances are discussed.

Key words: arrayed waveguide grating,  multiplexer,  manufacturing tolerance,  transmission spectrum,  crosstalk

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    Received: 18 August 2015 Revised: 16 February 2006 Online: Published: 01 May 2006

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      Article Navigation >  Journal of Semiconductors  > 2006  >  27(5): 926-931
      Qin Zhengkun, Ma Chunsheng, Li Delu, Zhang Haiming, Zhang Daming, Liu Shiyong. Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers[J]. Journal of Semiconductors, 2006, In Press. Qin Z K, Ma C S, Li D L, Zhang H M, Zhang D M, Liu S Y. Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers[J]. Chin. J. Semicond., 2006, 27(5): 926.Export: BibTex EndNote
      Citation:
      Qin Zhengkun, Ma Chunsheng, Li Delu, Zhang Haiming, Zhang Daming, Liu Shiyong. Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers[J]. Journal of Semiconductors, 2006, In Press.

      Qin Z K, Ma C S, Li D L, Zhang H M, Zhang D M, Liu S Y. Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers[J]. Chin. J. Semicond., 2006, 27(5): 926.
      Export: BibTex EndNote
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      Effect of Manufacturing Tolerances on Characteristics ofArrayed Waveguide Grating Multiplexers

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • Jilin Normal University, Siping 136000,China

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • College of Electronic Science and Engineering, State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun 130012,China

      • Received Date: 2015-08-18
      • Accepted Date: 2006-01-04
      • Revised Date: 2006-02-16
      • Published Date: 2006-10-12

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