Chin. J. Semicond. > 2000, Volume 21 > Issue 10 > 937-954

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Impactof Device Architecture on Performance and Reliability of Deep Submicron SOI MOSFETs( invited paper)

F.Balestra

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Key words: MOSFETs

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    Received: 20 August 2015 Revised: Online: Published: 01 October 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(10): 937-954
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      • Received Date: 2015-08-20

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