SEMICONDUCTOR PHYSICS

Impact of stray charge on interconnect wire via probability model of double-dot system

Xiangye Chen1, , Li Cai2, Qiang Zeng1 and Xinqiao Wang1

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 Corresponding author: Xiangye Chen, Email: conquor_fighter@qq.com

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Abstract: The behavior of quantum cellular automata (QCA) under the influence of a stray charge is quantified. A new time-independent switching paradigm, a probability model of the double-dot system, is developed. Superiority in releasing the calculation operation is presented by the probability model compared to previous stray charge analysis utilizing ICHA or full-basis calculation. Simulation results illustrate that there is a 186-nm-wide region surrounding a QCA wire where a stray charge will cause the target cell to switch unsuccessfully. The failure is exhibited by two new states' dominating the target cell. Therefore, a bistable saturation model is no longer applicable for stray charge analysis.

Key words: quantum cellular automatainterconnect wirestray chargeprobability model of double-dot system



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Fig. 1.  (a) Schematic diagram of an integrated cell[11]. (b) A two double-dot system consisting of an integrated cell[23].

Fig. 2.  Schematic diagram of a target DD and its driver cells.

Fig. 3.  States in probability model. (a) Two states exhibited by a DD cell. (b) Four states exhibited by an integrated cell.

Fig. 4.  Schematic diagram of a two cells wire.

Fig. 5.  Target cell performance with the driver cell of ‘1’.

Fig. 6.  Target cell performance with the driver cell of ‘0’.

Fig. 7.  Target cell performance with the driver cell of ‘0’.

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    Received: 20 May 2015 Revised: Online: Published: 01 February 2016

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      Xiangye Chen, Li Cai, Qiang Zeng, Xinqiao Wang. Impact of stray charge on interconnect wire via probability model of double-dot system[J]. Journal of Semiconductors, 2016, 37(2): 022002. doi: 10.1088/1674-4926/37/2/022002 X Y Chen, L Cai, Q Zeng, X Q Wang. Impact of stray charge on interconnect wire via probability model of double-dot system[J]. J. Semicond., 2016, 37(2): 022002. doi: 10.1088/1674-4926/37/2/022002.Export: BibTex EndNote
      Citation:
      Xiangye Chen, Li Cai, Qiang Zeng, Xinqiao Wang. Impact of stray charge on interconnect wire via probability model of double-dot system[J]. Journal of Semiconductors, 2016, 37(2): 022002. doi: 10.1088/1674-4926/37/2/022002

      X Y Chen, L Cai, Q Zeng, X Q Wang. Impact of stray charge on interconnect wire via probability model of double-dot system[J]. J. Semicond., 2016, 37(2): 022002. doi: 10.1088/1674-4926/37/2/022002.
      Export: BibTex EndNote

      Impact of stray charge on interconnect wire via probability model of double-dot system

      doi: 10.1088/1674-4926/37/2/022002
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      Project supported by the National Natural Science Foundation of China (No. 61172043) and the Key Program of Shaanxi Provincial Natural Science for Basic Research (No. 2011JZ015).

      More Information
      • Corresponding author: Email: conquor_fighter@qq.com
      • Received Date: 2015-05-20
      • Accepted Date: 2015-07-29
      • Published Date: 2016-01-25

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