Chin. J. Semicond. > 2003, Volume 24 > Issue S1 > 213-216

Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle

Qian Zhiyong, 马莒生 , Ma Jusheng, Cui Jianguo and Shi Jiaohua

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Abstract: Effect on luminance-homogeneity of projection screen by the fineness of SiO2 nano-particle is studied. The results show that With the decrease of the fineness of SiO2 , luminance-homogeneity can be improVed. Finally the reasons are discussed from the nano-structure point of VieW and the scattering principle.

Key words: fineness of SiO2 luminance-homogeneity defect-structure scattering 亮度均匀性 缺陷结构 散射

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    Received: 16 March 2016 Revised: Online: Published: 01 January 2003

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      Qian Zhiyong, Ma Jusheng, Cui Jianguo, Shi Jiaohua. Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle[J]. Journal of Semiconductors, 2003, In Press. Qian Z Y, Ma J S, Cui J G, Shi J H. Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle[J]. Chin. J. Semicond., 2003, 24(S1): 213.Export: BibTex EndNote
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      Qian Zhiyong, Ma Jusheng, Cui Jianguo, Shi Jiaohua. Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle[J]. Journal of Semiconductors, 2003, In Press.

      Qian Z Y, Ma J S, Cui J G, Shi J H. Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle[J]. Chin. J. Semicond., 2003, 24(S1): 213.
      Export: BibTex EndNote

      Effect on Luminance-Homogeneity of new Type Proj ection Screen by Fineness of SiO2 Nano-Particle

      • Received Date: 2016-03-16
      • Published Date: 2016-03-15

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