SEMICONDUCTOR MATERIALS

Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films

A. M. M. Tanveer Karim1, M. K. R. Khan2 and M. Mozibur Rahman2

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 Corresponding author: M. K. R. Khan, E-mail: fkrkhan@yahoo.co.uk

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Abstract: A series of ZnO-CdO thin films of different molar ratios of Zn and Cd have been deposited on glass substrate at substrate temperature ~ 360 ℃ by the spray pyrolysis technique at an ambient atmosphere. X-ray diffraction (XRD) studies confirmed the polycrystalline nature of the film and modulated crystal structures of wurtzite (ZnO) and cubic (CdO) are formed. The evaluated lattice parameters, and crystallite size are consistent with literature. Dislocation density and strain increased in the film as the grain sizes of ZnO and CdO are decreased. The band gap energy varies from 3.20 to 2.21 eV depending on the Zn/Cd ratios in the film. An incident photon intensity dependent I-V study confirmed that the films are highly photosensitive. Current increased with the increase of the intensity of the light beam. The optical conductivity and the optical constants, such as extinction coefficient, refractive index and complex dielectric constants are evaluated from transmittance and reflectance spectra of the films and these parameters are found to be sensitive to photon energy and displayed intermediate optical properties between ZnO and CdO, making it preferable for applications as the buffer and window layers in solar cells.

Key words: ZnO-CdObuffer layersXRDspray pyrolysis



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Fig. 1.  XRD patterns for ZnO-CdO thin films.

Fig. 2.  Optical transmittance and reflectance spectra of the ZnO-CdO films.

Fig. 3.  ($\alpha E)^{2}$ versus photon energy of the ZnO-CdO films.

Fig. 4.  Variation of refractive index with wavelength.

Fig. 5.  Variation of real and imaginary parts of dielectric constant with wavelength.

Fig. 6.  Variation of ln$\sigma $ with inverse temperature for ZnO-CdO thin films.

Fig. 7.  Variation of Hall constant and carrier concentration of ZnO-CdO films with Cd concentration.

Fig. 8.  Variation of photo currents of (a) ZnO, (b) Zn/Cd $=$ 3 : 1, (c) Zn/Cd $=$ 1 : 1, (d) Zn/Cd $=$ 1 : 3, and (e) CdO films.

Fig. 9.  Photosensitivity of ZnO-CdO films with different light intensities at fixed applied voltage.

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Table 1.   Crystallite size, dislocation densities and strain of ZnO and CdO crystal for the films of modulated phases of ZnO-CdO thin films.

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Table 2.   Crystallite size, dislocation densities and strain of ZnO and CdO crystal for the films of modulated phases of ZnO-CdO thin films.

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Table 3.   Optical band gap energy, activation energy, Hall constant, carrier concentration and resistivity of ZnO-CdO thin films.

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    Received: 26 December 2014 Revised: Online: Published: 01 May 2015

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      A. M. M. Tanveer Karim, M. K. R. Khan, M. Mozibur Rahman. Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films[J]. Journal of Semiconductors, 2015, 36(5): 053001. doi: 10.1088/1674-4926/36/5/053001 A. M. M. T. Karim, M. K. R. Khan, M. M. Rahman. Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films[J]. J. Semicond., 2015, 36(5): 053001. doi:  10.1088/1674-4926/36/5/053001.Export: BibTex EndNote
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      A. M. M. Tanveer Karim, M. K. R. Khan, M. Mozibur Rahman. Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films[J]. Journal of Semiconductors, 2015, 36(5): 053001. doi: 10.1088/1674-4926/36/5/053001

      A. M. M. T. Karim, M. K. R. Khan, M. M. Rahman. Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films[J]. J. Semicond., 2015, 36(5): 053001. doi:  10.1088/1674-4926/36/5/053001.
      Export: BibTex EndNote

      Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films

      doi: 10.1088/1674-4926/36/5/053001
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      • Corresponding author: E-mail: fkrkhan@yahoo.co.uk
      • Received Date: 2014-12-26
      • Accepted Date: 2014-12-04
      • Published Date: 2015-01-25

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