Chin. J. Semicond. > 2007, Volume 28 > Issue S1 > 133-136

Dislocations and Microdefects in Large Diameter SI-GaAs。

Zhao Yanqiao, Liu Caichi, Hao Qiuyan and Sun Weizhong

+ Author Affiliations

PDF

Abstract: The dislocation and micro-·defects in ф150mm SI-GaAs single crystal are investigated by means of chemical etching and microscopy observation.The experimental results show dislocations,micro-defects and cell structures in the samples. By analyzing the etching morphology of dislocations and micro-defects,the density and formation of defects in large diameter SIGaAs are discussed.

Key words: SI-GaAschemical etchingdislocationsmicrodefects

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 1942 Times PDF downloads: 479 Times Cited by: 0 Times

    History

    Received: 27 May 2016 Revised: Online: Published: 01 January 2007

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Zhao Yanqiao, Liu Caichi, Hao Qiuyan, Sun Weizhong. Dislocations and Microdefects in Large Diameter SI-GaAs。[J]. Journal of Semiconductors, 2007, In Press. Zhao Y Q, Liu C C, Hao Q Y, Sun W Z. Dislocations and Microdefects in Large Diameter SI-GaAs。[J]. Chin. J. Semicond., 2007, 28(S1): 133.Export: BibTex EndNote
      Citation:
      Zhao Yanqiao, Liu Caichi, Hao Qiuyan, Sun Weizhong. Dislocations and Microdefects in Large Diameter SI-GaAs。[J]. Journal of Semiconductors, 2007, In Press.

      Zhao Y Q, Liu C C, Hao Q Y, Sun W Z. Dislocations and Microdefects in Large Diameter SI-GaAs。[J]. Chin. J. Semicond., 2007, 28(S1): 133.
      Export: BibTex EndNote

      Dislocations and Microdefects in Large Diameter SI-GaAs。

      • Received Date: 2016-05-27
      • Published Date: 2016-04-28

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return