Chin. J. Semicond. > 1981, Volume 2 > Issue 2 > 161-163

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用电导法测定Si-SiO_2低界面态密度和俘获截面

史常忻 , 陆德仁 and 顾为芳

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1981

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      • Received Date: 2015-08-20

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