SEMICONDUCTOR DEVICES

A simulation study on a novel trench SJ IGBT

Wang Bo, Tan Jingfei, Zhang Wenliang, Chu Weili and Zhu Yangjun

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Abstract: An overall analysis of the trench superjunction insulated gate bipolar transistor (SJ IGBT) is presented and a detailed comparison between a trench SJ IGBT and a trench field stop IGBT is made by simulating with Sentaurus TCAD. More specifically, simulation results show that the trench SJ IGBT exhibits a breakdown voltage that is raised by 100 V while the on-state voltage is reduced by 0.2 V. At the same time, the turn-off loss is decreased by 50%. The effect of charge imbalance on the static and dynamic characteristics of the trench SJ IGBT is studied, and the trade-off between parameters and their sensitivity versus charge imbalance is discussed.

Key words: IGBTsuperjunctionSJBTcharge imbalanceon-state voltage

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    Received: 21 August 2015 Revised: 31 May 2012 Online: Published: 01 November 2012

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      Wang Bo, Tan Jingfei, Zhang Wenliang, Chu Weili, Zhu Yangjun. A simulation study on a novel trench SJ IGBT[J]. Journal of Semiconductors, 2012, 33(11): 114002. doi: 10.1088/1674-4926/33/11/114002 Wang B, Tan J F, Zhang W L, Chu W L, Zhu Y J. A simulation study on a novel trench SJ IGBT[J]. J. Semicond., 2012, 33(11): 114002. doi: 10.1088/1674-4926/33/11/114002.Export: BibTex EndNote
      Citation:
      Wang Bo, Tan Jingfei, Zhang Wenliang, Chu Weili, Zhu Yangjun. A simulation study on a novel trench SJ IGBT[J]. Journal of Semiconductors, 2012, 33(11): 114002. doi: 10.1088/1674-4926/33/11/114002

      Wang B, Tan J F, Zhang W L, Chu W L, Zhu Y J. A simulation study on a novel trench SJ IGBT[J]. J. Semicond., 2012, 33(11): 114002. doi: 10.1088/1674-4926/33/11/114002.
      Export: BibTex EndNote

      A simulation study on a novel trench SJ IGBT

      doi: 10.1088/1674-4926/33/11/114002
      Funds:

      National Major Science and Technology Special Project of China (NO. 2011ZX02504-002)

      • Received Date: 2015-08-21
      • Accepted Date: 2012-04-19
      • Revised Date: 2012-05-31
      • Published Date: 2012-10-23

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