| Citation: |
Zhong Yinghui, Wang Xiantai, Su Yongbo, Cao Yuxiong, Jin Zhi, Zhang Yuming, Liu Xinyu. Impact of the lateral width of the gate recess on the DC and RF characteristics of InAlAs/InGaAs HEMTs[J]. Journal of Semiconductors, 2012, 33(5): 054007. doi: 10.1088/1674-4926/33/5/054007
Zhong Y H, Wang X T, Su Y B, Cao Y X, Jin Z, Zhang Y M, Liu X Y. Impact of the lateral width of the gate recess on the DC and RF characteristics of InAlAs/InGaAs HEMTs[J]. J. Semicond., 2012, 33(5): 054007. doi: 10.1088/1674-4926/33/5/054007.
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Impact of the lateral width of the gate recess on the DC and RF characteristics of InAlAs/InGaAs HEMTs
doi: 10.1088/1674-4926/33/5/054007
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Abstract
We fabricated 88 nm gate-length InP-based InAlAs/InGaAs high electron mobility transistors (HEMTs) with a current gain cutoff frequency of 100 GHz and a maximum oscillation frequency of 185 GHz. The characteristics of HEMTs with side-etched region lengths (Lside) of 300, 412 and 1070 nm were analyzed. With the increase in Lside, the kink effect became notable in the DC characteristics, which resulted from the surface state and the effect of impact ionization. The kink effect was qualitatively explained through energy band diagrams, and then eased off by reducing the Lside. Meanwhile, the Lside dependence of the radio frequency characteristics, which were influenced by the parasitic capacitance, as well as the parasitic resistance of the source and drain, was studied. This work will be of great importance in fabricating high-performance InP HEMTs.-
Keywords:
- kink effect,
- HEMT,
- gate recess,
- InP,
- InAlAs/InGaAs
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References
[1] [2] [3] [4] [5] [6] [7] [8] -
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