| Citation: |
Tang Ning, Shen Bo, Wang Maojun, Yang Zhijian, Xu Ke, Zhang Guoyi, Gui Yongsheng, Zhu Bo, Guo Shaoling, Chu Junhao. Analysis of PTCDA/ITO Surface and Interface Using X-ray Photoelectron Spectroscopy and Atomic Force Microscopy[J]. Journal of Semiconductors, 2006, In Press.
Tang N, Shen B, Wang M J, Yang Z J, Xu K, Zhang G Y, Gui Y S, Zhu B, Guo S L, Chu J H. Analysis of PTCDA/ITO Surface and Interface Using X-ray Photoelectron Spectroscopy and Atomic Force Microscopy[J]. Chin. J. Semicond., 2006, 27(2): 235.
Export: BibTex EndNote
|
Analysis of PTCDA/ITO Surface and Interface Using X-ray Photoelectron Spectroscopy and Atomic Force Microscopy
-
Abstract
Magnetotransport properties of two-dimensional electron gases (2DEG) in AlxGa1-xN/GaN heterostructures with different Al compositions are investigated by magnetotransport measurements at low temperatures and in high magnetic fields.It is found that heterostructures with a lower Al composition in the barrier have lower 2DEG concentration and higher 2DEG mobility. -
References
-
Proportional views
DownLoad: