Chin. J. Semicond. > 2000, Volume 21 > Issue 12 > 1208-1213
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SiGe/SiHBT发射结的寄生势垒及其对器件室温和低温特性的影响

徐晨 , 沈光地 , 陈建新 , 邹德恕 , 李建军 , 罗辑 , 魏欢 , 周静 and 董欣

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Key words: SiGeHBT, 寄生势垒, 杂质偏析, 低温

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(12): 1208-1213
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      • Received Date: 2015-08-20

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