Chin. J. Semicond. > 2003, Volume 24 > Issue 8 > 833-836

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高阻值Cd_(1-x)Zn_xTe晶体的生长及其性能测试

李国强 , 谷智 and 介万奇

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Key words: Cd1-xZnxTe, 布里奇曼法, 电阻率, 红外透过率, 结晶质量

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    Received: 20 August 2015 Revised: Online: Published: 01 August 2003

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      • Received Date: 2015-08-20

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