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CONTENTS
Qi Haitao , Zhang Shilin , Guo Weilian , Liang Huilai and and Mao Luhong
Key words: HBT, ultra-thin base, device simulation, voltage-controlled NDR, PVCR
Article views: 1944 Times PDF downloads: 1214 Times Cited by: 0 Times
Received: 18 August 2015 Revised: Online: Published: 01 August 2005
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