| Citation: |
Hu Yi, Liu Yuling, Liu Xiaoyan, He Yangang, Wang Liran, Zhang Baoguo. Effect of alkaline slurry on the electric character of the pattern Cu wafer[J]. Journal of Semiconductors, 2011, 32(7): 076002. doi: 10.1088/1674-4926/32/7/076002
Hu Y, Liu Y L, Liu X Y, He Y G, Wang L R, Zhang B G. Effect of alkaline slurry on the electric character of the pattern Cu wafer[J]. J. Semicond., 2011, 32(7): 076002. doi: 10.1088/1674-4926/32/7/076002.
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Effect of alkaline slurry on the electric character of the pattern Cu wafer
doi: 10.1088/1674-4926/32/7/076002
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Abstract
For process integration considerations, we will investigate the impact of chemical mechanical polishing (CMP) on the electrical characteristics of the pattern Cu wafer. In this paper, we investigate the impacts of the CMP process with two kinds of slurry, one of which is acid slurry of SVTC and the other is FA/O alkaline slurry purchased from Tianjin Jingling Microelectronic Material Limited. Three aspects were investigated: resistance, capacitance and leakage current. The result shows that after polishing by the slurry of FA/O, the resistance is lower than the SVTC. After polishing by the acid slurry and FA/O alkaline slurry, the difference in capacitance is not very large. The values are 0.1 nF and 0.12 nF, respectively. The leakage current of the film polished by the slurry of FA/O is 0.01 nA, which is lower than the slurry of SVTC. The results show that the slurry of FA/O produced less dishing and oxide loss than the slurry of SVTC.-
Keywords:
- resistance
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References
[1] [2] [3] [4] [5] [6] [7] -
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