Chin. J. Semicond. > 2003, Volume 24 > Issue 11 > 1121-1129

CONTENTS

深亚微米工艺下互连线串扰问题的研究与进展(英文)

蔡懿慈 , 赵鑫 and 洪先龙

+ Author Affiliations

PDF

Key words: 互连线串扰, 串扰噪声, Keff模型, RLC精确噪声模型

    • Search

    Advanced Search >>

    Article Metrics

    Article views: 2557 Times PDF downloads: 1193 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 November 2003

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2003  >  24(11): 1121-1129
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return