Chin. J. Semicond. > 2006, Volume 27 > Issue S1 > 266-270

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Research of the Critical Parameters of Power RF LDMOS

Huang Xiaolan, Wu Dexin, Zhang Yaohui, Li Ke and Wang Lixin

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Abstract: Breakdown voltage,cutoff frequency fT and Ron are key parameters of power RF LDMOS devices.The measures of enhancing these characteristics are usually conflicting and restricting each other.The relations of these parameters are studied and the optimizing schemes are discussed.The progress and achievement in the field are also presented.

Key words: :RF LDMOSbreakdown voltagecut-off frequencypolysilicon oxidation

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2006

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      Huang Xiaolan, Wu Dexin, Zhang Yaohui, Li Ke, Wang Lixin. Research of the Critical Parameters of Power RF LDMOS[J]. Journal of Semiconductors, 2006, In Press. Huang X L, Wu D X, Zhang Y H, Li K, Wang L X. Research of the Critical Parameters of Power RF LDMOS[J]. Chin. J. Semicond., 2006, 27(13): 266.Export: BibTex EndNote
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      Huang Xiaolan, Wu Dexin, Zhang Yaohui, Li Ke, Wang Lixin. Research of the Critical Parameters of Power RF LDMOS[J]. Journal of Semiconductors, 2006, In Press.

      Huang X L, Wu D X, Zhang Y H, Li K, Wang L X. Research of the Critical Parameters of Power RF LDMOS[J]. Chin. J. Semicond., 2006, 27(13): 266.
      Export: BibTex EndNote

      Research of the Critical Parameters of Power RF LDMOS

      • Received Date: 2015-08-20

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