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Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy

Rao Lan, Song Guofeng and Chen Lianghui

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Abstract: In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet. By comparing the topographic images of two samples under different DC current injections, we can find that the thermal characteristic is related to its lifetime. We show that it is possible to predict the lifetime of the semiconductor laser diode with non-destructive tests.

Key words: semiconductor laser

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    Received: 18 August 2015 Revised: 07 April 2010 Online: Published: 01 October 2010

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      Rao Lan, Song Guofeng, Chen Lianghui. Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy[J]. Journal of Semiconductors, 2010, 31(10): 104007. doi: 10.1088/1674-4926/31/10/104007 Rao L, Song G F, Chen L H. Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy[J]. J. Semicond., 2010, 31(10): 104007. doi: 10.1088/1674-4926/31/10/104007.Export: BibTex EndNote
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      Rao Lan, Song Guofeng, Chen Lianghui. Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy[J]. Journal of Semiconductors, 2010, 31(10): 104007. doi: 10.1088/1674-4926/31/10/104007

      Rao L, Song G F, Chen L H. Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy[J]. J. Semicond., 2010, 31(10): 104007. doi: 10.1088/1674-4926/31/10/104007.
      Export: BibTex EndNote

      Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy

      doi: 10.1088/1674-4926/31/10/104007
      • Received Date: 2015-08-18
      • Accepted Date: 2010-04-07
      • Revised Date: 2010-04-07
      • Published Date: 2010-10-05

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