J. Semicond. > 2015, Volume 36 > Issue 9 > 092002, doi: 10.1088/1674-4926/36/9/092002
|

SEMICONDUCTOR PHYSICS

Polarization effects and tests for crystalline silicon solar cells

Weiming Lu, Zhigang Wang and Hui Hu

+ Author Affiliations

 Corresponding author: Lu Weiming, weiming.lu@etsolar.cn

PDF

Abstract: We try to find a fast and simple potential induced degradation effect (PID) test procedure for solar cells. With sodium chloride (NaCl) solution as Na+ source, PVB as lamination material, we can carry out the test for solar cells in 1 h. Solar cells with newly developed PID resistance process were also tested. The increase of reverse current of solar cells can be considered a key standard to determine if the solar cell was prone to PID. Moreover, it showed that the increase of reverse current for the PID resistance solar cell was less than 2. In addition, the test results of the solar cells fitted very well with that of the modules by standard procedure.

Key words: crystalline silicon solar cells, potential induced degradation, rapid test



[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
Fig1.  Schematic test setup with two-EVA laminates and a crystalline silicon cell in between. The outside surface of the front EVA has been equipped with copper foil. The foil and the cell's contacts have been connected to a laboratory DC power supply and have been stressed with a voltage of $-600$~V at 85 $^\circ C$ at 85% RH.

DownLoad: Full-Size Img PowerPoint
Fig2.  Electroluminescence images of the solar cell laminated by EVA (a) before and (b) after the test. Electroluminescence images of the solar cell laminated by PVB (c) before and (d) after the test.

DownLoad: Full-Size Img PowerPoint
Fig3.  Electroluminescence images of the solar cell painted by 5% NaCl solution (a) before and (b) after the test. Electroluminescence images of the solar cell painted by 20% NaCl solution (c) before and (d) after the test.

DownLoad: Full-Size Img PowerPoint
Fig4.  Electroluminescence images of the solar cell with silicon nitride layer featuring a refraction index of 2.08 (a) before and (b) after the test.

DownLoad: Full-Size Img PowerPoint
Fig5.  Electroluminescence images of the solar cell with silicon nitride layer featuring a refraction index of 2.12 (a) before and (b) after the test.

DownLoad: Full-Size Img PowerPoint
Fig6.  Electroluminescence images of the solar cell with silicon nitride layer featuring a refraction index of 2.14 (a) before and (b) after the test.

DownLoad: Full-Size Img PowerPoint
Fig7.  Electroluminescence images of the solar cell with SiO$_{2}$ film deposited by PECVD (a) before and (b) after the test.

DownLoad: Full-Size Img PowerPoint
Fig8.  Electroluminescence images of the solar cell with SiO$_{2}$ grown by ozone (a) before and (b) after the test.

DownLoad: Full-Size Img PowerPoint

Table 1.   The electrical parameters of the solar cell with silicon nitride layer featuring a refraction index of 2.08 before and after the test.

DownLoad: CSV

Table 2.   The electrical parameters of the solar cell with silicon nitride layer featuring a refraction index of 2.12 before and after the test.

DownLoad: CSV

Table 3.   Electrical parameters of the solar cell with silicon nitride layer featuring a refraction index of 2.14 before and after the test.

DownLoad: CSV

Table 4.   Electrical parameter of the solar cell with SiO$_{2}$ film deposited by PECVD before and after the test.

DownLoad: CSV

Table 5.   Electrical parameter of the solar cell grown by ozone before and after the test.

DownLoad: CSV

Table 6.   Power losses of the modules fabricated by solar cells with various processes after PID test.

DownLoad: CSV
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2784 Times PDF downloads: 15 Times Cited by: 0 Times

    History

    Received: 28 February 2015 Revised: Online: Published: 01 September 2015

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2015  >  36(9): 092002
      Weiming Lu, Zhigang Wang, Hui Hu. Polarization effects and tests for crystalline silicon solar cells[J]. Journal of Semiconductors, 2015, 36(9): 092002. doi: 10.1088/1674-4926/36/9/092002 W M Lu, Z G Wang, H Hu. Polarization effects and tests for crystalline silicon solar cells[J]. J. Semicond., 2015, 36(9): 092002. doi: 10.1088/1674-4926/36/9/092002.Export: BibTex EndNote
      Citation:
      Weiming Lu, Zhigang Wang, Hui Hu. Polarization effects and tests for crystalline silicon solar cells[J]. Journal of Semiconductors, 2015, 36(9): 092002. doi: 10.1088/1674-4926/36/9/092002

      W M Lu, Z G Wang, H Hu. Polarization effects and tests for crystalline silicon solar cells[J]. J. Semicond., 2015, 36(9): 092002. doi: 10.1088/1674-4926/36/9/092002.
      Export: BibTex EndNote
      shu

      Polarization effects and tests for crystalline silicon solar cells

      doi: 10.1088/1674-4926/36/9/092002

      • Enterprise Technology Center, Taizhou Detong Electric. Co. Ltd, Taizhou 225300, China

      More Information
      • Corresponding author: Lu Weiming, weiming.lu@etsolar.cn
      • Received Date: 2015-02-28
      • Accepted Date: 2015-04-15
      • Published Date: 2015-01-25

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return