Chin. J. Semicond. > 1993, Volume 14 > Issue 5 > 325-329

CONTENTS

a-Si:H中光致亚稳缺陷产生的弛豫过程:HCR和DCR模型的实验检验

孙国胜 and 孔光临

PDF

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 2078 Times PDF downloads: 1124 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 May 1993

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Export: BibTex EndNote
      Citation:


      Export: BibTex EndNote

      • Received Date: 2015-08-20

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return