Chin. J. Semicond. > 2005, Volume 26 > Issue 7 > 1390-1395

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超深亚微米LDD nMOSFET中的非幸运电子模型效应

杨林安 , 于春利 and 郝跃

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Key words: LDD nMOSFET热载流子退化沟道热载流子应力漏雪崩热载流子应力幸运电子模型

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    Received: 18 August 2015 Revised: Online: Published: 01 July 2005

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      • Received Date: 2015-08-18

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