J. Semicond. > 2008, Volume 29 > Issue 2 > 304-309

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Stochastic Analysis of Interconnect Delay in the Presence of Process Variations

Li Xin, Janet M. Wang, Tang Weiqing and Wu Huizhong

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Abstract: Process variations can reduce the accuracy in estimation of interconnect performance.This work presents a process variation based stochastic model and proposes an effective analytical method to estimate interconnect delay.The technique decouples the stochastic interconnect segments by an improved decoupling method.Combined with a polynomial chaos expression (PCE), this paper applies the stochastic Galerkin method (SGM) to analyze the system response.A finite representation of interconnect delay is then obtained with the complex approximation method and the bisection method.Results from the analysis match well with those from SPICE.Moreover, the method shows good computational efficiency, as the running time is much less than the SPICE simulation’s.

Key words: coupled interconnectsprocess variationsstochastic modelingdelay estimationstochastic Galerkin methodpolynomial chaos expression

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    Received: 18 August 2015 Revised: 01 October 2007 Online: Published: 01 February 2008

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      Li Xin, Janet M. Wang, Tang Weiqing, Wu Huizhong. Stochastic Analysis of Interconnect Delay in the Presence of Process Variations[J]. Journal of Semiconductors, 2008, In Press. Li X, Janet M. Wang, Tang W Q, Wu H Z. Stochastic Analysis of Interconnect Delay in the Presence of Process Variations[J]. J. Semicond., 2008, 29(2): 304.Export: BibTex EndNote
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      Li Xin, Janet M. Wang, Tang Weiqing, Wu Huizhong. Stochastic Analysis of Interconnect Delay in the Presence of Process Variations[J]. Journal of Semiconductors, 2008, In Press.

      Li X, Janet M. Wang, Tang W Q, Wu H Z. Stochastic Analysis of Interconnect Delay in the Presence of Process Variations[J]. J. Semicond., 2008, 29(2): 304.
      Export: BibTex EndNote

      Stochastic Analysis of Interconnect Delay in the Presence of Process Variations

      • Received Date: 2015-08-18
      • Accepted Date: 2007-08-22
      • Revised Date: 2007-10-01
      • Published Date: 2008-01-31

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