SEMICONDUCTOR INTEGRATED CIRCUITS

Modeling and analysis of single-event transients in charge pumps

Zhao Zhenyu, Li Junfeng, Zhang Minxuan and Li Shaoqing

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Abstract: It has been shown that charge pumps (CPs) dominate single-event transient (SET) responses of phase-locked loops (PLLs). Using a pulse to represent a single event hit on CPs, the SET analysis model is established and the characteristics of SET generation and propagation in PLLs are revealed. An analysis of single event transients in PLLs demonstrates that the settling time of the voltage-controlled oscillators (VCOs) control voltage after a single event strike is strongly dependent on the peak control voltage deviation, the SET pulse width, and the settling time constant. And the peak control voltage disturbance decreases with the SET strength or the filter resistance. Furthermore, the analysis in the proposed PLL model is confirmed by simulation results using MATLAB and HSPICE, respectively.

Key words: single event transient charge pump phase-locked loop

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    Received: 18 August 2015 Revised: 15 December 2008 Online: Published: 01 May 2009

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      Zhao Zhenyu, Li Junfeng, Zhang Minxuan, Li Shaoqing. Modeling and analysis of single-event transients in charge pumps[J]. Journal of Semiconductors, 2009, 30(5): 055006. doi: 10.1088/1674-4926/30/5/055006 Zhao Z Y, Li J F, Zhang M X, Li S Q. Modeling and analysis of single-event transients in charge pumps[J]. J. Semicond., 2009, 30(5): 055006. doi:  10.1088/1674-4926/30/5/055006.Export: BibTex EndNote
      Citation:
      Zhao Zhenyu, Li Junfeng, Zhang Minxuan, Li Shaoqing. Modeling and analysis of single-event transients in charge pumps[J]. Journal of Semiconductors, 2009, 30(5): 055006. doi: 10.1088/1674-4926/30/5/055006

      Zhao Z Y, Li J F, Zhang M X, Li S Q. Modeling and analysis of single-event transients in charge pumps[J]. J. Semicond., 2009, 30(5): 055006. doi:  10.1088/1674-4926/30/5/055006.
      Export: BibTex EndNote

      Modeling and analysis of single-event transients in charge pumps

      doi: 10.1088/1674-4926/30/5/055006
      • Received Date: 2015-08-18
      • Accepted Date: 2008-12-15
      • Revised Date: 2008-12-15
      • Published Date: 2009-04-20

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