| Citation: |
Xue Yuzhi, Martin A Green. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Journal of Semiconductors, 2003, In Press.
Xue Y Z, Martin A G. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Chin. J. Semicond., 2003, 24(S1): 65.
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Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203
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Abstract
Al/Al203 multilayers with nanometer scale are fabricated by thermal evaporation and natural oxidization techniques. The detection of X-ray and photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) is performed, and the curve ofei (ki ) is got. The properties of the negative resistance for the multilayers are found. -
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