J. Semicond. > 2008, Volume 29 > Issue 10 > 1922-1927

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MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling

Wang Huang, Sun Lingling, Yu Zhiping and Liu Jun

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Abstract: A novel large-signal equivalent circuit model of RF-SOI LDMOS based on Philips MOS Model 20 (MM20) is presented.The weak avalanche effect and the power dissipation caused by self-heating are described.The RF parasitic elements are extracted directly from measured S-parameters with analytical methods.Their final values can be obtained quickly and accurately through the necessary optimization.The model is validated in DC,AC small-signal,and large-signal analyses for an RF-SOI LDMOS of 20-fingers (channel mask length,L=1μm,finger width,W=50μm) gate with high resistivity substrate and body-contact.Excellent agreement is achieved between simulated and measured results for DC,S-parameters (10MHz~2.01GHz),and power characteristics,which shows our model is accurate and reliable.MM20 is improved for RF-SOI LDMOS large-signal applications.This model has been implemented in Verilog-A using the ADS circuit simulator (hpeesofsim).

Key words: RF-SOI LDMOSlarge-signal modelMOS Model 20harmonic powerVerilog-A

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    Received: 18 August 2015 Revised: 23 June 2008 Online: Published: 01 October 2008

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      Wang Huang, Sun Lingling, Yu Zhiping, Liu Jun. MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling[J]. Journal of Semiconductors, 2008, In Press. Wang H, Sun L L, Yu Z P, Liu J. MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling[J]. J. Semicond., 2008, 29(10): 1922.Export: BibTex EndNote
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      Wang Huang, Sun Lingling, Yu Zhiping, Liu Jun. MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling[J]. Journal of Semiconductors, 2008, In Press.

      Wang H, Sun L L, Yu Z P, Liu J. MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling[J]. J. Semicond., 2008, 29(10): 1922.
      Export: BibTex EndNote

      MOS Model 20 Based RF-SOI LDMOS Large-Signal Modeling

      • Received Date: 2015-08-18
      • Accepted Date: 2008-03-27
      • Revised Date: 2008-06-23
      • Published Date: 2008-11-11

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