Chin. J. Semicond. > 2007, Volume 28 > Issue S1 > 253-256

Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth

Ma Ping, Duan Yao, Wei Tongbo, Duan Ruifei, Wang Junxi, Zeng Yiping and Li Jinmin

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Abstract: According to the model of fluid dynamic,distribution of gas concentration,as well as the thermal field,in the reactor was simulated.NH3 concentration distributes homogeneously around the substrate,while GaCl concentration is larger in center than that in the periphery.The experimental results show that the growth rate is 260 um/h in center and 140pm/h in the periphery,respectively.The FWHM is 141”.It is O impurity that arouses the strong yellow uminescence.

Key words: HVPEtheoretical simulationGaN

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    Received: 27 May 2016 Revised: Online: Published: 01 January 2007

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      Ma Ping, Duan Yao, Wei Tongbo, Duan Ruifei, Wang Junxi, Zeng Yiping, Li Jinmin. Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth[J]. Journal of Semiconductors, 2007, In Press. Ma P, Duan Y, Wei T B, Duan R F, Wang J X, Zeng Y P, Li J M. Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth[J]. Chin. J. Semicond., 2007, 28(S1): 253.Export: BibTex EndNote
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      Ma Ping, Duan Yao, Wei Tongbo, Duan Ruifei, Wang Junxi, Zeng Yiping, Li Jinmin. Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth[J]. Journal of Semiconductors, 2007, In Press.

      Ma P, Duan Y, Wei T B, Duan R F, Wang J X, Zeng Y P, Li J M. Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth[J]. Chin. J. Semicond., 2007, 28(S1): 253.
      Export: BibTex EndNote

      Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth

      • Received Date: 2016-05-27
      • Published Date: 2016-04-28

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