Chin. J. Semicond. > 2006, Volume 27 > Issue 1 > 24-29

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A Novel Algorithm to Extract Weighted Critical Area

Wang Junping, Hao Yue, Zhang Huining, Zhang Xiaoju and Ren Chunli

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Abstract: Inductive fault analysis is a technique for enumerating likely bridges that is limited by the weighted critical area computation.Based on the rectangle model of a real defect and mathematical morphology,an efficient algorithm is presented to compute the weighted critical area of a layout.The algorithm avoids the need to determine which rectangles belong to a net and the merging of the critical area corresponding to a net pair.Experimental results showing the algorithm’s performance are presented.

Key words: bridge faultdefect rectangle modellayout analysismathematical morphology

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    Received: 20 August 2015 Revised: Online: Published: 01 January 2006

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      Wang Junping, Hao Yue, Zhang Huining, Zhang Xiaoju, Ren Chunli. A Novel Algorithm to Extract Weighted Critical Area[J]. Journal of Semiconductors, 2006, In Press. Wang J P, Hao Y, Zhang H N, Zhang X J, Ren C L. A Novel Algorithm to Extract Weighted Critical Area[J]. Chin. J. Semicond., 2006, 27(1): 24.Export: BibTex EndNote
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      Wang Junping, Hao Yue, Zhang Huining, Zhang Xiaoju, Ren Chunli. A Novel Algorithm to Extract Weighted Critical Area[J]. Journal of Semiconductors, 2006, In Press.

      Wang J P, Hao Y, Zhang H N, Zhang X J, Ren C L. A Novel Algorithm to Extract Weighted Critical Area[J]. Chin. J. Semicond., 2006, 27(1): 24.
      Export: BibTex EndNote

      A Novel Algorithm to Extract Weighted Critical Area

      • Received Date: 2015-08-20

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