Chin. J. Semicond. > 2006, Volume 27 > Issue 3 > 560-563

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A Failure-Mechanism Identification Method in Accelerated Testing

Guo Chunsheng, Xie Xuesong, Ma Weidong, Cheng Yaohai and Li Zhiguo

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Abstract: Through the study of a failure mechanism model--the Arrhenius model--of electronic devices in accelerated testing,it is found that the relation between the rate of degradation of failure sensitive parameters and the negative reciprocal of operating stress follows an exponential rule in accelerated testing.Based on the relationship,a failure-mechanism identification method in accelerated testing is presented.Then a progress-stress accelerated test is constructed in the temperature range of 150~310℃,and the consistent failure-mechanism range proves that the method is feasible.

Key words: accelerated testingfailure mechanismidentification

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    Received: 20 August 2015 Revised: Online: Published: 01 March 2006

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      Guo Chunsheng, Xie Xuesong, Ma Weidong, Cheng Yaohai, Li Zhiguo. A Failure-Mechanism Identification Method in Accelerated Testing[J]. Journal of Semiconductors, 2006, In Press. Guo C S, Xie X S, Ma W D, Cheng Y H, Li Z G. A Failure-Mechanism Identification Method in Accelerated Testing[J]. Chin. J. Semicond., 2006, 27(3): 560.Export: BibTex EndNote
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      Guo Chunsheng, Xie Xuesong, Ma Weidong, Cheng Yaohai, Li Zhiguo. A Failure-Mechanism Identification Method in Accelerated Testing[J]. Journal of Semiconductors, 2006, In Press.

      Guo C S, Xie X S, Ma W D, Cheng Y H, Li Z G. A Failure-Mechanism Identification Method in Accelerated Testing[J]. Chin. J. Semicond., 2006, 27(3): 560.
      Export: BibTex EndNote

      A Failure-Mechanism Identification Method in Accelerated Testing

      • Received Date: 2015-08-20

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