SEMICONDUCTOR INTEGRATED CIRCUITS

A 5 Gb/s low area CDR for embedded clock serial links

You Li, Junsheng Lü, Yumei Zhou, Jianzhong Zhao, Yuhu Chen and Feng Zhang

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 Corresponding author: You Li, E-mail: liyou1@ime.ac.cn

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Abstract: A multi-standard compatible clock and data recovery circuit (CDR) with a programmable equalizer and wide tracking range is presented. Considering the jitter performance, tracking range and chip area, the CDR employs a first-order digital loop filter, two 6-bit DACs and high linearity phase interpolators to achieve high phase resolution and low area. Meanwhile the tracking range is greater than ± 2200 ppm, making this proposed CDR suitable for the embedded clock serial links. A test chip was fabricated in the 55 nm CMOS process. The measurements show that the test chip can achieve BER <10-12 and meet the jitter tolerance specification. The test chip occupies 0.19 mm2 with a 0.0486 mm2 CDR core, which only consumes 30 mW from a 1.2 V supply at 5 Gb/s.

Key words: clock and data recoveryfrequency and phase trackingdigital filterbang—bang PDphase interpolator



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Fig. 1.  Common serial link architecture. (a) Forward clock architecture. (b) Embedded clock architecture.

Fig. 2.  RX architecture.

Fig. 3.  (a) The simplified block of embedded clock architecture. (b) The jitter tolerance specification.

Fig. 4.  System view of the implemented first-order BB CDR.

Fig. 5.  (a) RX input front-end and samplers. (b) SADFF. (c) CML to CMOS converters. (d) Phase adjustment.

Fig. 6.  The digital block diagram of the proposed CDR.

Fig. 7.  Phase interpolator and DAC.

Fig. 8.  The phase linearity of the recovery clock simulated by Hspice.

Fig. 9.  A micrograph of the test chip.

Fig. 10.  The test setups and measurement results (a) using Tektronix BERT to measure the jitter tolerance curve, (b) the measured jitter tolerance curve, (c) using FPGA to measure the BER of the test chip, (d) the eye diagram of the RX retimed data, and (e) the measurement result of (c).

Table 1.   The designed parameters.

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Table 2.   Performance comparison of RX.

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    Received: 10 July 2014 Revised: Online: Published: 01 February 2015

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      You Li, Junsheng Lü, Yumei Zhou, Jianzhong Zhao, Yuhu Chen, Feng Zhang. A 5 Gb/s low area CDR for embedded clock serial links[J]. Journal of Semiconductors, 2015, 36(2): 025005. doi: 10.1088/1674-4926/36/2/025005 Y Li, J Lü, Y M Zhou, J Z Zhao, Y H Chen, F Zhang. A 5 Gb/s low area CDR for embedded clock serial links[J]. J. Semicond., 2015, 36(2): 025005. doi: 10.1088/1674-4926/36/2/025005.Export: BibTex EndNote
      Citation:
      You Li, Junsheng Lü, Yumei Zhou, Jianzhong Zhao, Yuhu Chen, Feng Zhang. A 5 Gb/s low area CDR for embedded clock serial links[J]. Journal of Semiconductors, 2015, 36(2): 025005. doi: 10.1088/1674-4926/36/2/025005

      Y Li, J Lü, Y M Zhou, J Z Zhao, Y H Chen, F Zhang. A 5 Gb/s low area CDR for embedded clock serial links[J]. J. Semicond., 2015, 36(2): 025005. doi: 10.1088/1674-4926/36/2/025005.
      Export: BibTex EndNote

      A 5 Gb/s low area CDR for embedded clock serial links

      doi: 10.1088/1674-4926/36/2/025005
      Funds:

      Project supported by the National High Technology Research and Development Program of China (No. 2011AA010403), the National Natural Science Foundation of China (No. 61474134), and the National Science and Technology Major Project (No. 2014ZX02302002).

      More Information
      • Corresponding author: E-mail: liyou1@ime.ac.cn
      • Received Date: 2014-07-10
      • Accepted Date: 2014-10-05
      • Published Date: 2015-01-25

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