J. Semicond. > 2008, Volume 29 > Issue 1 > 157-162

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Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam

Li Ming, Song Jing, Huang Qing’an and Tang Jieying

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Abstract: To characterize the effect of deformation of die-bonding packages on the performance of MEMS devices,a laser scanning vibrometer was used,based on the theory of vibration analysis and signal processing.Because it is a commonly used structure in MEMS design,a surface micromachined polysilicon fixed-fixed beam was chosen.Its resonant frequencies from the 1st to the 3rd order were recorded before and after die bonding and compared to FEM simulations.The results suggest that the thermo-mechanical coupling deformation in the multilayer packaging structure affects the performance of MEMS device remarkably,and the resonant frequencies shift of the beam are more than 15%~30%.Therefore,it is possible to include the package effect in the primary design circle of MEMS devices,which may enhance the device performance and shorten the primary design cycle.

Key words: MEMSpackaging effectfixed-fixed beamresonant frequencyco-design

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    Received: 18 August 2015 Revised: 19 August 2007 Online: Published: 01 January 2008

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      Li Ming, Song Jing, Huang Qing’an, Tang Jieying. Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam[J]. Journal of Semiconductors, 2008, In Press. Li M, Song J, Huang Q, Tang J Y. Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam[J]. J. Semicond., 2008, 29(1): 157.Export: BibTex EndNote
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      Li Ming, Song Jing, Huang Qing’an, Tang Jieying. Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam[J]. Journal of Semiconductors, 2008, In Press.

      Li M, Song J, Huang Q, Tang J Y. Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam[J]. J. Semicond., 2008, 29(1): 157.
      Export: BibTex EndNote

      Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam

      • Received Date: 2015-08-18
      • Accepted Date: 2007-05-24
      • Revised Date: 2007-08-19
      • Published Date: 2007-12-26

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