SEMICONDUCTOR INTEGRATED CIRCUITS

A new physical unclonable function architecture

Chuang Bai, Xuecheng Zou and Kui Dai

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 Corresponding author: Xuecheng Zou, E-mail: estxczou@gmail.com

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Abstract: This paper describes a new silicon physical unclonable function (PUF) architecture that can be fabricated on a standard CMOS process. Our proposed architecture is built using process sensors, difference amplifier, comparator, voting mechanism and diffusion algorithm circuit. Multiple identical process sensors are fabricated on the same chip. Due to manufacturing process variations, each sensor produces slightly different physical characteristic values that can be compared in order to create a digital identification for the chip. The diffusion algorithm circuit ensures further that the PUF based on the proposed architecture is able to effectively identify a population of ICs. We also improve the stability of PUF design with respect to temporary environmental variations like temperature and supply voltage with the introduction of difference amplifier and voting mechanism. The PUF built on the proposed architecture is fabricated in 0.18 μm CMOS technology. Experimental results show that the PUF has a good output statistical characteristic of uniform distribution and a high stability of 98.1% with respect to temperature variation from —40 to 100 ℃, and supply voltage variation from 1.7 to 1.9 V.

Key words: physical unclonable functionsdigital identificationprocess sensorsvoting mechanismdiffusion algorithm



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Fig. 1.  Comparison of (a) traditional and (b) new PUF architectures.

Fig. 2.  Voting mechanism circuit.

Fig. 3.  Diffusion algorithm circuit.

Fig. 4.  The new PUF based on the proposed architecture.

Fig. 5.  (a) Layout of PUF chip and (b) amplified partial circuits.

Fig. 6.  Statistical distribution map of IDs derived from prototype PUFs (a) without diffusion algorithm circuit and (b) with diffusion algorithm circuit.

Fig. 7.  Hamming distance distribution for prototype PUFs (a) without diffusion algorithm circuit and (b) with diffusion algorithm circuit.

Fig. 8.  PUF reliability versus temperature sweep.

Fig. 9.  PUF reliability versus supply voltage sweep.

Fig. 10.  Error rates of IDs for various PUF implementations.

Table 1.   Performance comparison of the phase shifter.

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    Received: 04 September 2014 Revised: Online: Published: 01 March 2015

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      Chuang Bai, Xuecheng Zou, Kui Dai. A new physical unclonable function architecture[J]. Journal of Semiconductors, 2015, 36(3): 035005. doi: 10.1088/1674-4926/36/3/035005 C Bai, X C Zou, K Dai. A new physical unclonable function architecture[J]. J. Semicond., 2015, 36(3): 035005. doi: 10.1088/1674-4926/36/3/035005.Export: BibTex EndNote
      Citation:
      Chuang Bai, Xuecheng Zou, Kui Dai. A new physical unclonable function architecture[J]. Journal of Semiconductors, 2015, 36(3): 035005. doi: 10.1088/1674-4926/36/3/035005

      C Bai, X C Zou, K Dai. A new physical unclonable function architecture[J]. J. Semicond., 2015, 36(3): 035005. doi: 10.1088/1674-4926/36/3/035005.
      Export: BibTex EndNote

      A new physical unclonable function architecture

      doi: 10.1088/1674-4926/36/3/035005
      Funds:

      Project supported by the National Natural Science Foundation of China (No. 61376031).

      More Information
      • Corresponding author: E-mail: estxczou@gmail.com
      • Received Date: 2014-09-04
      • Accepted Date: 2014-10-08
      • Published Date: 2015-01-25

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