Chin. J. Semicond. > 2007, Volume 28 > Issue S1 > 513-515

High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’

Li Yuntao, Yu Jinzhong, Li ZhiYang and Chen Shaowu

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Abstract: A driving circuit is designed on the basis of analyzing of the influences of heaters on the reliability of 16×16 SOI thermo-optic switch matrix.And the reliability of the device improves from 34.9% to 92.30%,assuming the probability of destroyed heaters is 5%.At the same time,the I/O ports after package decreases from 34 to 10. Based on the new driving cir cur.a high-reliability 16×16 SOl thermo-optic switch matrix is designed.

Key words: thermo-optic switch matrixdriving circuitreliability

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    Received: 27 May 2016 Revised: Online: Published: 01 January 2007

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      Li Yuntao, Yu Jinzhong, Li ZhiYang, Chen Shaowu. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Journal of Semiconductors, 2007, In Press. Li Y T, Yu J Z, Li Z Y, Chen S W. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Chin. J. Semicond., 2007, 28(S1): 513.Export: BibTex EndNote
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      Li Yuntao, Yu Jinzhong, Li ZhiYang, Chen Shaowu. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Journal of Semiconductors, 2007, In Press.

      Li Y T, Yu J Z, Li Z Y, Chen S W. High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’[J]. Chin. J. Semicond., 2007, 28(S1): 513.
      Export: BibTex EndNote

      High-Reliability 16×16 SOI Thermo-Optic Switch Matrix’

      • Received Date: 2016-05-27
      • Published Date: 2016-04-28

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