Chin. J. Semicond. > 2006, Volume 27 > Issue 1 > 54-58

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Elmore Delay Estimation of Two Adjacent Coupling Interconnects

Dong Gang, Yang Yintang and Li Yuejin

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Abstract: An approach for analyzing coupling RC interconnect delay based on "effective capacitance" is presented.We compare this new method to the traditional method,which uses Miller capacitance.The results show that the new method not only improves the accuracy but also reflects the delay dependence on rise time.The method has the same complexity as the Elmore delay model and can be used in performance-driven routing optimization

Key words: capacitance extractioncoupling RC interconnecteffective capacitancedelay

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    Received: 20 August 2015 Revised: Online: Published: 01 January 2006

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      Dong Gang, Yang Yintang, Li Yuejin. Elmore Delay Estimation of Two Adjacent Coupling Interconnects[J]. Journal of Semiconductors, 2006, In Press. Dong G, Yang Y T, Li Y J. Elmore Delay Estimation of Two Adjacent Coupling Interconnects[J]. Chin. J. Semicond., 2006, 27(1): 54.Export: BibTex EndNote
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      Dong Gang, Yang Yintang, Li Yuejin. Elmore Delay Estimation of Two Adjacent Coupling Interconnects[J]. Journal of Semiconductors, 2006, In Press.

      Dong G, Yang Y T, Li Y J. Elmore Delay Estimation of Two Adjacent Coupling Interconnects[J]. Chin. J. Semicond., 2006, 27(1): 54.
      Export: BibTex EndNote

      Elmore Delay Estimation of Two Adjacent Coupling Interconnects

      • Received Date: 2015-08-20

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