Chin. J. Semicond. > 1985, Volume 6 > Issue 1 > 86-89
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一种直接由C-t参数确定未知掺杂样品产生寿命的方法

张秀淼

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1985

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      Article Navigation >  Journal of Semiconductors  > 1985  >  6(1): 86-89
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      • Received Date: 2015-08-20

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