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A neutron radiation-hardened superluminescent diode

Jiao Jian, Tan Manqing, Zhao Miao and Chang Jinlong

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Abstract: We present a novel superluminescent diode (SLD) with high optical performances for hardened neutron irradiation. The degradation of the light output from the SLDs is caused by a reduction of the minority carrier lifetime resulting from displacement damage after high-energy neutron irradiation. The SLDs with a higher pre-irradiation light output will be less sensitive to radiation. We have selected an InGaAsP/InP multi-quantum well (MQW) as the active region structure for its performance, its high optical gain and minute active region. Graded-index separate-confinement-heterostructure (GRIN-SCH) has been applied for the waveguide structure. A specific absorbing region and anti-reflective coatings have been designed and optimized. Moreover, the radiation test results indicate that the SLD with an InGaAsP/InP MQW structure has better neutron hardening ability than the SLD with DH structures after a 6 × 1013-1 × 1014 n/cm2 1 MeV neutron irradiation.

Key words: superluminescent diode

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    Received: 20 August 2015 Revised: 10 April 2012 Online: Published: 01 September 2012

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      Jiao Jian, Tan Manqing, Zhao Miao, Chang Jinlong. A neutron radiation-hardened superluminescent diode[J]. Journal of Semiconductors, 2012, 33(9): 094006. doi: 10.1088/1674-4926/33/9/094006 Jiao J, Tan M Q, Zhao M, Chang J L. A neutron radiation-hardened superluminescent diode[J]. J. Semicond., 2012, 33(9): 094006. doi: 10.1088/1674-4926/33/9/094006.Export: BibTex EndNote
      Citation:
      Jiao Jian, Tan Manqing, Zhao Miao, Chang Jinlong. A neutron radiation-hardened superluminescent diode[J]. Journal of Semiconductors, 2012, 33(9): 094006. doi: 10.1088/1674-4926/33/9/094006

      Jiao J, Tan M Q, Zhao M, Chang J L. A neutron radiation-hardened superluminescent diode[J]. J. Semicond., 2012, 33(9): 094006. doi: 10.1088/1674-4926/33/9/094006.
      Export: BibTex EndNote

      A neutron radiation-hardened superluminescent diode

      doi: 10.1088/1674-4926/33/9/094006
      • Received Date: 2015-08-20
      • Accepted Date: 2012-03-05
      • Revised Date: 2012-04-10
      • Published Date: 2012-08-21

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