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Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes

Maoxing Chen, Chen Xu, Kun Xu and Lei Zheng

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 Corresponding author: Xu Chen, xuchen58@bjut.edu.cn

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Abstract: Conventional GaN-based flip-chip light-emitting diodes (CFC-LEDs) use Au bumps to contact the LED chip and Si submount, however the contact area is constrained by the number of Au bumps, limiting the heat dissipation performance. This paper presents a flat surface high power GaN-based flip-chip light emitting diode (SFC-LED), which can greatly improve the heat dissipation performance of the device. In order to understand the thermal performance of the SFC-LED thoroughly, a 3-D finite element model (FEM) is developed, and ANSYS is used to simulate the thermal performance. The temperature distributions of the SFC-LED and the CFC-LED are shown in this article, and the junction temperature simulation values of the SFC-LED and the CFC-LED are 112.80℃ and 122.97℃, respectively. Simulation results prove that the junction temperature of the new structure is 10.17℃ lower than that of the conventional structure. Even if the CFC-LED has 24 Au bumps, the thermal resistance of the new structure is still far less than that of the conventional structure. The SFC-LED has a better thermal property.

Key words: light-emitting diodeflip-chipfinite-element modeljunction temperature



[1]
Steigerwald D A, Bhat J C, Collins D, et al. Illumination with solid state lighting technology. IEEE J Sel Topics Quantum Electron, 2002, 8(2):310 doi: 10.1109/2944.999186
[2]
Lee H K, Yu J S, Lee Y T. Thermal analysis and characterization of the effect of substrate thinning on the performances of GaN-based light emitting diodes. Phys Status Solidi A:Applications and Materials Science, 2010, 207(6):1497 doi: 10.1002/pssa.200925575
[3]
Fan B, Wu H, Zhao Y, et al. Thermal study of high-power nitride-based flip-chip light-emitting diodes. IEEE Trans Electron Devices, 2008, 55(12):3375 doi: 10.1109/TED.2008.2006534
[4]
Ye H, Sau K, Van Zeijl H, et al. A review of passive thermal management of LED module. Journal of Semiconductors, 2011, 32(1):014008 doi: 10.1088/1674-4926/32/1/014008
[5]
Wang C, Chen T, Fu H, et al. Analysis of thermal characteristics and mechanism of degradation of flip-chip high power LEDs. Microelectron Reliab, 2012, 52(4):698 doi: 10.1016/j.microrel.2011.11.009
[6]
Shan Q, Dai Q, Chhajed S, et al. Analysis of thermal properties of GaInN light-emitting diodes and laser diodes. J Appl Phys, 2010, 108(8):4504 doi: 10.1063/1.3493117
[7]
Lin C, Chang L, Jeng M, et al. Fabrication and thermal analysis of flip-chip light-emitting diodes with different numbers of Au stub bumps. Microelectron Reliab, 2010, 50(5):683 doi: 10.1016/j.microrel.2010.01.036
[8]
Hou F, Yang D, Zhang G. Thermal analysis of LED lighting system with different fin heat sinks. Journal of Semiconductors, 2011, 32(1):014006 doi: 10.1088/1674-4926/32/1/014006
[9]
Hu J, Yang L, Hwang W J, et al. Thermal and mechanical analysis of delamination in GaN-based light-emitting diode packages. J Cryst Growth, 2006, 288(1):157 doi: 10.1016/j.jcrysgro.2005.12.049
[10]
Tian X, Chen W, Zhang J. Thermal design for the high-power LED lamp. Journal of Semiconductors, 2011, 32(1):014009 doi: 10.1088/1674-4926/32/1/014009
[11]
Chen J, Wen S, Yao R, et al. Thermal analysis of high-power LED without aluminum substrate. Chinese Journal of Luminescence, 2012, 33(12):1362 doi: 10.3788/fgxb
[12]
Kang J, Choi J, Kim D, et al. Fabrication and thermal analysis of wafer-level light-emitting diode packages. IEEE Electron Device Lett, 2008, 29(10):1118 doi: 10.1109/LED.2008.2002749
[13]
Yang L, Hu J, Kim L, et al. Thermal analysis of GaN-based light emitting diodes with different chip sizes. IEEE Trans Device Mater Reliab, 2008, 8(3):571 doi: 10.1109/TDMR.2008.2002357
Fig. 1.  Schematic views of (a) SFC-LED and (b) CFC-LED.

Fig. 2.  (a) Cross-section of the SFC-LED structure and (b) the CFC-LED structure.

Fig. 3.  (a) Temperature contour of the SFC-LED and (b) the CFCLED.

Fig. 4.  The junction temperature using different insulation materials.

Fig. 5.  (a) Results of junction temperature and (b) thermal resistance.

Table 1.   Thermal conductivity of materials.

[1]
Steigerwald D A, Bhat J C, Collins D, et al. Illumination with solid state lighting technology. IEEE J Sel Topics Quantum Electron, 2002, 8(2):310 doi: 10.1109/2944.999186
[2]
Lee H K, Yu J S, Lee Y T. Thermal analysis and characterization of the effect of substrate thinning on the performances of GaN-based light emitting diodes. Phys Status Solidi A:Applications and Materials Science, 2010, 207(6):1497 doi: 10.1002/pssa.200925575
[3]
Fan B, Wu H, Zhao Y, et al. Thermal study of high-power nitride-based flip-chip light-emitting diodes. IEEE Trans Electron Devices, 2008, 55(12):3375 doi: 10.1109/TED.2008.2006534
[4]
Ye H, Sau K, Van Zeijl H, et al. A review of passive thermal management of LED module. Journal of Semiconductors, 2011, 32(1):014008 doi: 10.1088/1674-4926/32/1/014008
[5]
Wang C, Chen T, Fu H, et al. Analysis of thermal characteristics and mechanism of degradation of flip-chip high power LEDs. Microelectron Reliab, 2012, 52(4):698 doi: 10.1016/j.microrel.2011.11.009
[6]
Shan Q, Dai Q, Chhajed S, et al. Analysis of thermal properties of GaInN light-emitting diodes and laser diodes. J Appl Phys, 2010, 108(8):4504 doi: 10.1063/1.3493117
[7]
Lin C, Chang L, Jeng M, et al. Fabrication and thermal analysis of flip-chip light-emitting diodes with different numbers of Au stub bumps. Microelectron Reliab, 2010, 50(5):683 doi: 10.1016/j.microrel.2010.01.036
[8]
Hou F, Yang D, Zhang G. Thermal analysis of LED lighting system with different fin heat sinks. Journal of Semiconductors, 2011, 32(1):014006 doi: 10.1088/1674-4926/32/1/014006
[9]
Hu J, Yang L, Hwang W J, et al. Thermal and mechanical analysis of delamination in GaN-based light-emitting diode packages. J Cryst Growth, 2006, 288(1):157 doi: 10.1016/j.jcrysgro.2005.12.049
[10]
Tian X, Chen W, Zhang J. Thermal design for the high-power LED lamp. Journal of Semiconductors, 2011, 32(1):014009 doi: 10.1088/1674-4926/32/1/014009
[11]
Chen J, Wen S, Yao R, et al. Thermal analysis of high-power LED without aluminum substrate. Chinese Journal of Luminescence, 2012, 33(12):1362 doi: 10.3788/fgxb
[12]
Kang J, Choi J, Kim D, et al. Fabrication and thermal analysis of wafer-level light-emitting diode packages. IEEE Electron Device Lett, 2008, 29(10):1118 doi: 10.1109/LED.2008.2002749
[13]
Yang L, Hu J, Kim L, et al. Thermal analysis of GaN-based light emitting diodes with different chip sizes. IEEE Trans Device Mater Reliab, 2008, 8(3):571 doi: 10.1109/TDMR.2008.2002357
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    Received: 27 March 2013 Revised: 12 May 2013 Online: Published: 01 December 2013

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      Maoxing Chen, Chen Xu, Kun Xu, Lei Zheng. Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes[J]. Journal of Semiconductors, 2013, 34(12): 124005. doi: 10.1088/1674-4926/34/12/124005 M X Chen, C Xu, K Xu, L Zheng. Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes[J]. J. Semicond., 2013, 34(12): 124005. doi: 10.1088/1674-4926/34/12/124005.Export: BibTex EndNote
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      Maoxing Chen, Chen Xu, Kun Xu, Lei Zheng. Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes[J]. Journal of Semiconductors, 2013, 34(12): 124005. doi: 10.1088/1674-4926/34/12/124005

      M X Chen, C Xu, K Xu, L Zheng. Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes[J]. J. Semicond., 2013, 34(12): 124005. doi: 10.1088/1674-4926/34/12/124005.
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      Thermal simulation and analysis of flat surface flip-chip high power light-emitting diodes

      doi: 10.1088/1674-4926/34/12/124005
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      • Corresponding author: Xu Chen, xuchen58@bjut.edu.cn
      • Received Date: 2013-03-27
      • Revised Date: 2013-05-12
      • Published Date: 2013-03-01

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