J. Semicond. > 2008, Volume 29 > Issue 9 > 1666-1669

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Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect

Sun Yan, Chen Xin and Dai Ning

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Abstract: We describe the fabrication of metal nanogaps of sub-20nm in feature size using the proximity effect in electron beam lithography (EBL).The proximity effect is extended to develop a flexible and practical method for preparing metal (e.g.Au or Ag) nanogaps and arrays in combination with a transfer process (e.g.,deposition/lift-off).Different from the direct gap-writing process,the nanogap precursor structures (nanoconnections) were designed by GDSII software and then written by electron beam.Following a deposition and lift-off process,the metal nanogaps were obtained and the nanogap size can be lowered to ~10nm by controlling the exposure dose in EBL.

Key words: metal nanogapnanofabricationproximity effectelectron beam lithography

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    Received: 18 August 2015 Revised: 29 April 2008 Online: Published: 01 September 2008

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      Sun Yan, Chen Xin, Dai Ning. Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect[J]. Journal of Semiconductors, 2008, In Press. Sun Y, Chen X, Dai N. Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect[J]. J. Semicond., 2008, 29(9): 1666.Export: BibTex EndNote
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      Sun Yan, Chen Xin, Dai Ning. Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect[J]. Journal of Semiconductors, 2008, In Press.

      Sun Y, Chen X, Dai N. Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect[J]. J. Semicond., 2008, 29(9): 1666.
      Export: BibTex EndNote

      Fabrication of Sub-20nm Metal Nanogaps from Nanoconnections by the Extended Proximity Effect

      • Received Date: 2015-08-18
      • Accepted Date: 2008-03-08
      • Revised Date: 2008-04-29
      • Published Date: 2008-09-03

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