Chin. J. Semicond. > 2003, Volume 24 > Issue 12 > 1303-1306

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Key words: AFM针尖诱导氧化, 阳极氧化, Ti氧化物, 偏压, 扫描速度

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2003

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      • Received Date: 2015-08-20

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