SEMICONDUCTOR DEVICES

A novel approach for justification of box-triangular germanium profile in SiGe HBTs

Gagan Khanduri and Brishbhan Panwar

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 Corresponding author: Gagan Khanduri, E-mail: gagan@ieee.org

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Abstract: This work presents a unique and robust approach for validation of using the box-triangular germanium profile in the base of SiGe heterojunction bipolar transistors, where the methodology considers the simultaneous optimization of the p-type base doping profile in conjunction with the germanium profile in the base. The study analyses the electron motion across the SiGe base in SiGe HBTs, owing to different accelerating electric fields. The analysis first presents a figure of merit, to achieve the minimum electron transit time across the base in conjunction with the increased current gain in n—p—n-SiGe HBTs, which shows a general trend vis-v-vis the advantage of a trapezoid germanium profile, but with additional accuracy as we considered simultaneously optimized p-type base doping. The effect of minority carrier velocity saturation is then included to make the study more detailed. The analysis then investigates the shifted germanium profile in the base to further minimize the base transit time. Finally, it is shown that a shifted germanium profile eventually evolves into a box-triangular Ge-profile in the SiGe base, which could simultaneously minimize the base transit time and reduce emitter delay by virtue of the high current gain. The analysis verifies that for an average Ge-dose of 7.5% Ge across the base, a box-triangular germanium profile in conjunction with an optimum base doping profile has an approximately identical base transit time and a 30% higher current gain, in comparison with an optimum base doping and triangular Ge-profile across the whole base.

Key words: SiGe HBTsbase transit timeoptimum base dopingshifted Ge profilebox-triangular germanium profile



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Fig. 1.  Different Ge profiles used for analyzing optimum base dopant distribution for minimum base transit time. All profiles have fixed Ge dose equivalent to uniform 12.5 % Ge in the base, while varying the Ge slope.

Fig. 2.  Optimized base doping profiles and corresponding electron transit time across the base for different Ge-slope profiles. All profiles have fixed Ge dose equivalent to uniform 12.5 % Ge in the base, while varying the Ge-slope across the base.

Fig. 3.  Figure-of-merit ($\beta$/$t_{\rm B})$ as a function of Ge % difference between emitter-base and base-collector junction.

Fig. 4.  Electron transit time across the base as a function of various linear Ge % slopes for optimized base doping with and without velocity saturation effect inclusion.

Fig. 5.  Electron apparent velocity as a function of distance for various linear Ge % slopes across the base, with velocity saturation effect inclusion.

Fig. 6.  Optimized base doping profiles with, and, without shifted Ge-profile inside the base for Ge-dose equivalent to uniform 7.5 % Ge across the base.

Fig. 7.  Electron apparent velocity as a function of distance for Ge-profile having a 15.7 % Ge-slope across 0.827$W_{\rm B}$ after a Ge-shift of 0.173$W_{\rm B}$ from the emitter-base edge (profile-1) in comparison with the Ge-profile having linear 15 % Ge-ramp across the total base width (profile-2).

Fig. 8.  Optimum base doping profiles as a function of distance for Ge-profile having a 15.7 % Ge-slope across 0.827$W_{\rm B}$ after a Ge-shift of 0.173$W_{\rm B}$ from the emitter-base edge (profile-1) in comparison with the Ge-profile having a linear 15 % Ge-ramp across the total base width (profile-2).

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Table 1.   FOM for box-triangular SiGe HBT.

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    Received: 06 August 2014 Revised: Online: Published: 01 February 2015

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      Gagan Khanduri, Brishbhan Panwar. A novel approach for justification of box-triangular germanium profile in SiGe HBTs[J]. Journal of Semiconductors, 2015, 36(2): 024002. doi: 10.1088/1674-4926/36/2/024002 G Khanduri, B Panwar. A novel approach for justification of box-triangular germanium profile in SiGe HBTs[J]. J. Semicond., 2015, 36(2): 024002. doi:  10.1088/1674-4926/36/2/024002.Export: BibTex EndNote
      Citation:
      Gagan Khanduri, Brishbhan Panwar. A novel approach for justification of box-triangular germanium profile in SiGe HBTs[J]. Journal of Semiconductors, 2015, 36(2): 024002. doi: 10.1088/1674-4926/36/2/024002

      G Khanduri, B Panwar. A novel approach for justification of box-triangular germanium profile in SiGe HBTs[J]. J. Semicond., 2015, 36(2): 024002. doi:  10.1088/1674-4926/36/2/024002.
      Export: BibTex EndNote

      A novel approach for justification of box-triangular germanium profile in SiGe HBTs

      doi: 10.1088/1674-4926/36/2/024002
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      • Corresponding author: E-mail: gagan@ieee.org
      • Received Date: 2014-08-06
      • Accepted Date: 2014-09-25
      • Published Date: 2015-01-25

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