Chin. J. Semicond. > 2007, Volume 28 > Issue 7 > 1012-1016

LETTERS

Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer

Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong and Wang Qiming

+ Author Affiliations

PDF

Abstract: A polarization-maintaining (PM) fiber Mach-Zehnder (MZ) interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy.Unlike a common MZ interferometer,all the components are connected via polarization-maintaining fibers.At the same time,a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio.Here,we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs,KTP,and GaN as comparative samples.The measured EO coefficients show good comparability with the others.

Key words: electro-optic effectpolarization-maintaining fiberMach-Zehnder interferometer

  • Search

    Advanced Search >>

    Article Metrics

    Article views: 3208 Times PDF downloads: 1351 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: 20 March 2007 Online: Published: 01 July 2007

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong, Wang Qiming. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Journal of Semiconductors, 2007, In Press. Tu X G, Zhao L, Chen P, Chen S W, Zuo Y H, Yu J Z, Wang Q M. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Chin. J. Semicond., 2007, 28(7): 1012.Export: BibTex EndNote
      Citation:
      Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong, Wang Qiming. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Journal of Semiconductors, 2007, In Press.

      Tu X G, Zhao L, Chen P, Chen S W, Zuo Y H, Yu J Z, Wang Q M. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Chin. J. Semicond., 2007, 28(7): 1012.
      Export: BibTex EndNote

      Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer

      • Received Date: 2015-08-18
      • Accepted Date: 2007-01-28
      • Revised Date: 2007-03-20
      • Published Date: 2007-07-05

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return