Chin. J. Semicond. > 2002, Volume 23 > Issue 8 > 817-824

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Key words: 响应表面方法, 实验设计, 器件稳健性设计

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    Received: 19 August 2015 Revised: Online: Published: 01 August 2002

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      • Received Date: 2015-08-19

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