| Citation: |
Wang Lijuan, Zhan Feng, Yu Ying, Zhu Yan, Liu Shaoqing, Huang Shesong, Ni Haiqiao, Niu Zhichuan. Influence of window layer thickness on double layer antireflection coating for triple junction solar cells[J]. Journal of Semiconductors, 2011, 32(6): 066001. doi: 10.1088/1674-4926/32/6/066001
Wang L J, Zhan F, Yu Y, Zhu Y, Liu S Q, Huang S S, Ni H Q, Niu Z C. Influence of window layer thickness on double layer antireflection coating for triple junction solar cells[J]. J. Semicond., 2011, 32(6): 066001. doi: 10.1088/1674-4926/32/6/066001.
Export: BibTex EndNote
|
Influence of window layer thickness on double layer antireflection coating for triple junction solar cells
doi: 10.1088/1674-4926/32/6/066001
-
Abstract
The optimization of a SiO2/TiO2, SiO2/ZnS double layer antireflection coating (ARC) on Ga0.5In0.5P/In0.02Ga0.98As/Ge solar cells for terrestrial application is discussed. The Al0.5In0.5P window layer thickness is also taken into consideration. It is shown that the optimal parameters of double layer ARC vary with the thickness of the window layer.-
Keywords:
- reflection curves
-
References
-
Proportional views
DownLoad: