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A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs

He Jin, Zhang Jian, Zhang Lining, Ma Chenyue and Chan Mansun

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Abstract: A surface potential based non-charge-sheet core model for cylindrical undoped surrounding-gate (SRG) MOSFETs is presented. It is based on the exact surface potential solution of Poisson's equation and Pao-Sah's dual integral without the charge-sheet approximation, allowing the SRG-MOSFET characteristics to be adequately described by a single set of the analytic drain current equation in terms of the surface potential evaluated at the source and drain ends. It is valid for all operation regions and traces the transition from the linear to saturation and from the sub-threshold to strong inversion region without fitting-parameters, and verified by the 3-D numerical simulation.

Key words: non-classical?MOS?transistor

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    Received: 18 August 2015 Revised: 26 October 2008 Online: Published: 01 February 2009

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      He Jin, Zhang Jian, Zhang Lining, Ma Chenyue, Chan Mansun. A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs[J]. Journal of Semiconductors, 2009, 30(2): 024001. doi: 10.1088/1674-4926/30/2/024001 He J, Zhang J, Zhang L N, Ma C Y, Chan M S. A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs[J]. J. Semicond., 2009, 30(2): 024001. doi: 10.1088/1674-4926/30/2/024001.Export: BibTex EndNote
      Citation:
      He Jin, Zhang Jian, Zhang Lining, Ma Chenyue, Chan Mansun. A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs[J]. Journal of Semiconductors, 2009, 30(2): 024001. doi: 10.1088/1674-4926/30/2/024001

      He J, Zhang J, Zhang L N, Ma C Y, Chan M S. A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs[J]. J. Semicond., 2009, 30(2): 024001. doi: 10.1088/1674-4926/30/2/024001.
      Export: BibTex EndNote

      A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs

      doi: 10.1088/1674-4926/30/2/024001
      • Received Date: 2015-08-18
      • Accepted Date: 2008-05-20
      • Revised Date: 2008-10-26
      • Published Date: 2009-02-16

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