SEMICONDUCTOR DEVICES

Improvements to the extraction of an AlGaN/GaN HEMT small-signal model

Pu Yan, Pang Lei, Wang Liang, Chen Xiaojuan, Li Chengzhan and Liu Xinyu

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Abstract: The accurate extraction of AlGaN/GaN HEMT small-signal models, which is an important step in large-signal modeling, can exactly reflect the microwave performance of the physical structure of the device. A new method of extracting the parasitic elements is presented, and an open dummy structure is introduced to obtain the parasitic capacitances. With a Schottky resistor in the gate, a new method is developed to extract Rg. In order to characterize the changes of the depletion region under various drain voltages, the drain delay factor is involved in the output conductance of the device. Compared to the traditional method, the fitting of S11 and S22 is improved, and fT and fmax can be better predicted. The validity of the proposed method is verified with excellent correlation between the measured and simulated S-parameters in the range of 0.1 to 26.1 GHz.

Key words: AlGaN/GaN HEMT small-signal model Schottky resistor drain delay

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    Received: 18 August 2015 Revised: 15 July 2009 Online: Published: 01 December 2009

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      Pu Yan, Pang Lei, Wang Liang, Chen Xiaojuan, Li Chengzhan, Liu Xinyu. Improvements to the extraction of an AlGaN/GaN HEMT small-signal model[J]. Journal of Semiconductors, 2009, 30(12): 124003. doi: 10.1088/1674-4926/30/12/124003 Pu Y, Pang L, Wang L, Chen X J, Li C Z, Liu X Y. Improvements to the extraction of an AlGaN/GaN HEMT small-signal model[J]. J. Semicond., 2009, 30(12): 124003. doi:  10.1088/1674-4926/30/12/124003.Export: BibTex EndNote
      Citation:
      Pu Yan, Pang Lei, Wang Liang, Chen Xiaojuan, Li Chengzhan, Liu Xinyu. Improvements to the extraction of an AlGaN/GaN HEMT small-signal model[J]. Journal of Semiconductors, 2009, 30(12): 124003. doi: 10.1088/1674-4926/30/12/124003

      Pu Y, Pang L, Wang L, Chen X J, Li C Z, Liu X Y. Improvements to the extraction of an AlGaN/GaN HEMT small-signal model[J]. J. Semicond., 2009, 30(12): 124003. doi:  10.1088/1674-4926/30/12/124003.
      Export: BibTex EndNote

      Improvements to the extraction of an AlGaN/GaN HEMT small-signal model

      doi: 10.1088/1674-4926/30/12/124003
      • Received Date: 2015-08-18
      • Accepted Date: 2009-06-14
      • Revised Date: 2009-07-15
      • Published Date: 2009-12-04

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