Chin. J. Semicond. > 2006, Volume 27 > Issue 6 > 1051-1054

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Fabrication of ZnO Thin-Film Transistors by L-MBE

Zhang Xin’an, Zhang Jingwen, Yang Xiaodong, Lou Hui, 刘振玲 , Liu Zhenling and Zhang Weifeng

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Abstract: High quality ZnO films are deposited on SiNx/Si substrate by laser molecular beam epitaxy(L-MBE).XRD and AFM are used to investigate the crystallite and surface of the films, respectively.The results show that the films are homogeneous and crack-free with highly preferred c orientation.We fabricate thin film transistors with ZnO as an active channel layer that works well in the n-channel enhancement mode and have a threshold voltage of 17.5V and a mobility rate as high as 1.05cm2/(V·s).

Key words: L-MBEZnO thin filmsthin film transistor

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    Received: 20 August 2015 Revised: Online: Published: 01 June 2006

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      Zhang Xin’an, Zhang Jingwen, Yang Xiaodong, Lou Hui, Liu Zhenling, Zhang Weifeng. Fabrication of ZnO Thin-Film Transistors by L-MBE[J]. Journal of Semiconductors, 2006, In Press. Zhang X, Zhang J W, Yang X D, Lou H, Liu Z L, Zhang W F. Fabrication of ZnO Thin-Film Transistors by L-MBE[J]. Chin. J. Semicond., 2006, 27(6): 1051.Export: BibTex EndNote
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      Zhang Xin’an, Zhang Jingwen, Yang Xiaodong, Lou Hui, Liu Zhenling, Zhang Weifeng. Fabrication of ZnO Thin-Film Transistors by L-MBE[J]. Journal of Semiconductors, 2006, In Press.

      Zhang X, Zhang J W, Yang X D, Lou H, Liu Z L, Zhang W F. Fabrication of ZnO Thin-Film Transistors by L-MBE[J]. Chin. J. Semicond., 2006, 27(6): 1051.
      Export: BibTex EndNote

      Fabrication of ZnO Thin-Film Transistors by L-MBE

      • Received Date: 2015-08-20

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