Fig. 1.
Schematic of the readout circuit for one channel.
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| Citation: |
Bo Gan, Tingcun Wei, Wu Gao, Yongcai Hu. Design and performances of a low-noise and radiation-hardened readout ASIC for CdZnTe detectors[J]. Journal of Semiconductors, 2016, 37(6): 065007. doi: 10.1088/1674-4926/37/6/065007
B Gan, T C Wei, W Gao, Y C Hu. Design and performances of a low-noise and radiation-hardened readout ASIC for CdZnTe detectors[J]. J. Semicond., 2016, 37(6): 065007. doi: 10.1088/1674-4926/37/6/065007.
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Design and performances of a low-noise and radiation-hardened readout ASIC for CdZnTe detectors
doi: 10.1088/1674-4926/37/6/065007
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Abstract
In this paper, we present the design and performances of a low-noise and radiation-hardened front-end readout application specific integrated circuit (ASIC) dedicated to CdZnTe detectors for a hard X-ray imager in space applications. The readout channel is comprised of a charge sensitive amplifier, a CR-RC shaping amplifier, an analog output buffer, a fast shaper, and a discriminator. An 8-channel prototype ASIC is designed and fabricated in TSMC 0.35-μm mixed-signal CMOS technology, the die size of the prototype chip is 2.2×2.2 mm2. The input energy range is from 5 to 350 keV. For this 8-channel prototype ASIC, the measured electrical characteristics are as follows:the overall gain of the readout channel is 210 V/pC, the linearity error is less than 2%, the crosstalk is less than 0.36%, The equivalent noise charge of a typical channel is 52.9 e- at zero farad plus 8.2 e- per picofarad, and the power consumption is less than 2.4 mW/channel. Through the measurement together with a CdZnTe detector, the energy resolution is 5.9% at the 59.5-keV line under the irradiation of the radioactive source 241Am. The radiation effect experiments show that the proposed ASIC can resist the total ionization dose (TID) irradiation of higher than 200 krad(Si).-
Keywords:
- CdZnTe detector,
- low-noise,
- front-end readout,
- ASIC,
- X-ray,
- radiation-hardened
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References
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